Abstract: A computer-based method and system is disclosed that automates the design and layout of digital multiplier circuits. The preferred method utilizes an automatic design generator having a user interface which receives design requirements for a digital multiplier circuit design. A digital multiplier design generator receives the design requirements for the digital multiplier and retrieves relevant component implementations from a component library. Stored digital multiplier benchmarks are then retrieved from a benchmark memory and applied to corresponding digital multipliers to determine which of the various implementations optimally satisfies the user design requirements. Once the optimal digital multiplier implementation is selected, the digital multiplier design generator produces a logic design including a netlist and a physical design including design directives which are then used to place and route the digital multiplier as a finished layout.

Abstract: A method provides an on-chip repair technique to fix defective row or I/O memory lines in an ASIC memory array with redundancy row or I/O memory lines. The method employs progressive urgency and dynamic repair schemes to optimize the allotted time for repairing defective row and I/O memory lines. Progressive urgency scheme increases the need to repair relative to the available redundancy row or I/O memory lines over the entire repairing time. Dynamic repair executes a mandatory-row or a mandatory-I/O repair as defective row or I/O memory lines are detected. In addition, a recurrence error reroutes the address location of a redundancy memory line to another address location of another redundancy memory line in the event that such redundancy memory line itself is defective, and thus requires further repair.

Abstract: A system and method are provided herein for creating and validating an electronic design structural description of a circuit or device from a VHDL description of the circuit or device which includes a compiler for compiling the VHDL description of the circuit or device; a device for locating problems within the compiled description and measuring the effectiveness of solving the problems; a device for passing information including the compiled description to a physical design level; a physical design tool for receiving the information and creating a physical design therefrom; and a device for back annotating the information from the physical design tool to the compiler.

Abstract: A computer-based system and method automate the generation of megacells in the design and layout of integrated circuits. The preferred method utilizes an automatic design generator having a user interface which receives design requirements for a megacell or other complex integrated circuit design. A megacell processor receives the design requirements for the megacell and retrieves relevant megacell implementations from a megacell library. Stored megacell benchmarks are then retrieved from a megacell benchmark memory and applied to corresponding megacells to determine which of the various implementations optimally satisfies the user design requirements. Once the optimal megacell implementation is selected, the megacell processor produces a logic design consisting of a net list and a physical design consisting of design directives which are then used to place and route the megacell as a finished layout.

Abstract: A built-in self-repair system includes an on-chip clock generator for triggering the repairing process to repair defective memory lines or blocks in a memory array of an ASIC chip. The on-chip clock generator enables the self-repair process to start at the power up of a computer system without a need for an external test-triggering signal. The system includes a built-in self-test circuit that tests for a defective row memory line or a defective I/O memory block. The system further includes a fault-latching-and repair-execution circuit that repairs a row memory line or an I/O memory block. Repairing an IO memory block effectively repairs faults that occur between any two adjacent column shorts within an IO memory block. The preferred repairing scheme adopts a 15N diagnosis to achieve high fault correction so that a large percentage of defective memory cells can be replaced by redundant row memory lines or redundant I/O memory blocks.

Abstract: A logic circuit and a technique for repairing faulty memory cells internally by employing on-chip testing and repairing circuits in an ASIC system. The test circuit detects column line faults, row faults, and data retention faults in a memory array. The repair circuit redirects the original address locations of the faulty memory lines to the mapped address locations of the redundant column or row lines. This repair scheme includes redundant column lines attached to each of the I/O arrays in the memory array and redundant row lines to replace detected memory faults. These testing and repairing procedures are performed within the chip without the aid of any external equipment.

Abstract: An automatic logic-model generation system operates on a behavioral description of an electronic design (e.g., a circuit, a system, etc.) to automatically generate a low-level (i.e., circuit-level) design of the electronic design, to lay out the electronic design for production in the form of an integrated circuit, and to produce logic-level models incorporating accurate timing (and delay) information. A verification process is also performed whereby the logic-level model is automatically verified for accuracy.

Abstract: An automatic logic-model generation system operates on a schematic database and produces logic models incorporating accurate timing information. A verification process is also performed whereby the model is automatically verified for accuracy.

Abstract: An automatic logic-model generation system operates on a schematic database and produces logic models incorporating accurate timing information. A verification process is also performed whereby the model is automatically verified for accuracy.