Patents by Inventor Oz Hershkovitz

Oz Hershkovitz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10061672
    Abstract: A method and apparatus are provided for implementing random content of program loops in random test generation for processor verification. A converged branch instruction stream is used by a test generator to ensure that all random conditional branches converge to a main program loop. A built in exception handling mechanism of the test generator enables program interrupts to converge to the main program loop. Mandatory read only registers applied to the test generator allow all register based storage addresses to use registers that maintain a value and thus stabilize the storage address translations through subsequent iterations of the loop. A global class restriction mechanism defines specific restricted instruction classes applied to the test generator avoids inherently problematic operations for the program loops. Machine state detection and restoration mechanisms in the test generator are provided to preserve storage addressability.
    Type: Grant
    Filed: March 7, 2013
    Date of Patent: August 28, 2018
    Assignee: International Business Machines Corporation
    Inventors: Adi Dagan, Avishai Fedida, Olaf K. Hendrickson, Oz Hershkovitz
  • Patent number: 9251023
    Abstract: A method and apparatus are provided for implementing automated memory address recording in constrained random test generation for verification of processor hardware designs. A test generation program includes a built in feature to keep track of storage addresses used and to make the addresses available to the test definition. This built in feature of a constrained random test generator allows storage addresses used in the past to be accessed by the current instruction generation eliminating the requirement of deliberately establishing target addresses first. This allows separate test events to interact with the same storage addresses without having to write a special test.
    Type: Grant
    Filed: March 7, 2013
    Date of Patent: February 2, 2016
    Assignee: International Business Machines Corporation
    Inventors: Craig T. Atherton, Avishai Fedida, Olaf K. Hendrickson, Oz Hershkovitz
  • Publication number: 20140257736
    Abstract: A method and apparatus are provided for implementing automated memory address recording in constrained random test generation for verification of processor hardware designs. A test generation program includes a built in feature to keep track of storage addresses used and to make the addresses available to the test definition. This built in feature of a constrained random test generator allows storage addresses used in the past to be accessed by the current instruction generation eliminating the requirement of deliberately establishing target addresses first. This allows separate test events to interact with the same storage addresses without having to write a special test.
    Type: Application
    Filed: March 7, 2013
    Publication date: September 11, 2014
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Craig T. Atherton, Avishai Fedida, Olaf K. Hendrickson, Oz Hershkovitz
  • Publication number: 20140257739
    Abstract: A method and apparatus are provided for implementing random content of program loops in random test generation for processor verification. A converged branch instruction stream is used by a test generator to ensure that all random conditional branches converge to a main program loop. A built in exception handling mechanism of the test generator enables program interrupts to converge to the main program loop. Mandatory read only registers applied to the test generator allow all register based storage addresses to use registers that maintain a value and thus stabilize the storage address translations through subsequent iterations of the loop. A global class restriction mechanism defines specific restricted instruction classes applied to the test generator avoids inherently problematic operations for the program loops. Machine state detection and restoration mechanisms in the test generator are provided to preserve storage addressability.
    Type: Application
    Filed: March 7, 2013
    Publication date: September 11, 2014
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Adi Dagan, Avishai Fedida, Olaf K. Hendrickson, Oz Hershkovitz