Abstract: One embodiment is a microelectronic assembly including an assembly support structure; a first die including a pair of hot via comprising through-substrate-via (TSVs) extending through the first die between first and second sides thereof and a plurality of ground vias surrounding the pair of hot vias and extending through the first die between the first and second sides thereof. The first die further includes a pair of signal interconnect structures electrically connected to the pair of hot vias disposed on the second side of the first die. The assembly further includes a second die between the assembly support structure and the first die the pair of signal interconnect structures disposed on the first side thereof. The first die is connected to the second die via a signal die-to-die (DTD) interconnect structure including the signal interconnect structures of the first and second dies.

Abstract: One embodiment is a microelectronic assembly including an assembly support structure; a first die including a pair of hot via comprising through-substrate-via (TSVs) extending through the first die between first and second sides thereof and a plurality of ground vias surrounding the pair of hot vias and extending through the first die between the first and second sides thereof. The first die further includes a pair of signal interconnect structures electrically connected to the pair of hot vias disposed on the second side of the first die. The assembly further includes a second die between the assembly support structure and the first die the pair of signal interconnect structures disposed on the first side thereof. The first die is connected to the second die via a signal die-to-die (DTD) interconnect structure including the signal interconnect structures of the first and second dies.

Abstract: One embodiment is an apparatus comprising a silicon-on-insulator (“SOI”) substrate comprising an insulating layer sandwiched in between a bottom silicon layer and a top silicon layer; a radiating element disposed on a top surface of the SOI substrate; and at least one cavity disposed in the SOI substrate surrounding the radiating element, wherein the at least one cavity extends from a bottom surface of the bottom silicon layer to a bottom surface of the insulating layer.

Abstract: One embodiment is an apparatus comprising a silicon-on-insulator (“SOI”) substrate comprising an insulating layer sandwiched in between a bottom silicon layer and a top silicon layer; a radiating element disposed on a top surface of the SOI substrate; and at least one cavity disposed in the SOI substrate surrounding the radiating element, wherein the at least one cavity extends from a bottom surface of the bottom silicon layer to a bottom surface of the insulating layer.

Abstract: A process for coating fresh eggs with a coating composition including coating the eggs with a polyethylene glycol-lactide aqueous dispersion, the process being useful for: reducing microbial content both within and outside the fresh eggs, preventing further contamination of the fresh eggs, extending the shelf life of the fresh eggs, maintaining the quality of the fresh eggs, and increasing the strength of the shells of the fresh eggs.

Abstract: This process is designed to coat fresh chicken eggs with polyethylene glycol-lactide. The process reduces possible microbial content which may be inside fresh eggs while preventing the contamination of the eggs after being laid. It also extends the shelf life while maintaining the quality of the eggs. In addition, the PEG coating lowers the rate of fractures related to the egg shell while being handled, whether that be during storage, when the eggs are transported, or when the eggs are transferred to a market display.