Abstract: A test and measurement system for a frequency-hopping communication system includes a radio frequency antenna structured to receive a signal from a frequency-hopping data transmitting device including at least two frames of data in which the at least two frames of data are sent at two or more unique radio frequencies, and a decoder structured to decode the at least two frames of data without prior knowledge at which radio frequencies the frequency-hopping device were to be sent. Methods are also described.

Abstract: A test and measurement system includes a radio frequency antenna structured to receive a wireless carrier signal generated by an NFC vicinity coupling device and to receive load-modulated wireless carrier signals generated by one or more vicinity integrated circuit cards in response to the wireless carrier signal, and a response detector structured to determine if any load-modulated wireless carrier signals generated by one or more vicinity integrated circuit cards were received by the antenna. The response detector may use cross-correlation to determine if the load-modulated wireless carrier signals are present.

Abstract: A system and method of making frequency domain measurements on a waveform acquired by a time domain instrument, such as an oscilloscope, uses built-in FFT spectral analysis in the time domain instrument so that a user can perform the compliance measurements using the oscilloscope alone. The results of the measurement made by the oscilloscope are made comparable to those made by a spectral analyzer by improving dynamic range, noise floor, and measurement accuracy, by averaging on the time domain oscilloscope.

Abstract: A system and method for performing power spectral density (PSD) and power level measurements for measuring PSD required by 10GBaseT applications, using a single test and measurement instrument, such as a real time oscilloscope is described. That is, an oscilloscope includes processing circuitry which receives an input signal and converts it to raw data, it then transforms the raw data into specific analyzed displayable data by algorithmically deriving PSD from spectral data and plotting the PSD data along with limit values on a display screen of the oscilloscope.

Abstract: An apparatus and method measures the skew between signals on data and clock channels using a bit pattern matching technique for any given protocol in Serial data communication. In one embodiment, the method of finding the pattern comprises of importing the waveform data from the oscilloscope and converting the waveform into bit patterns, finding the pattern index on the converted bit stream using a pattern based on the TMDS channel combination, and then measuring the skew.

Abstract: An oscilloscope performs an in-circuit measurement of voltage across, and current through, a core winding of an inductor, and derives the actual B and H values with n number of turns, receives data indicative of the magnetic length of the circuit, and plots the B_H curve. The oscilloscope then derives the value of Saturation flux density (Bsat), Remnant flux density (Br), Permeability (?), and Coercivity (Hc) from this B-H plot. Characterizing the operating region of the magnetic component while it operates in a Switch Mode Power Supply (SMPS) under test, provides information concerning the stability of the power supply that was heretofore unavailable.

Abstract: An oscilloscope performs an in-circuit measurement of voltage across, and current through, a core winding of an inductor, and derives the actual B and H values with n number of turns, receives data indicative of the magnetic length of the circuit, and plots the B_H curve. The oscilloscope then derives the value of Saturation flux density (Bsat), Remnant flux density (Br), Permeability (?), and Coercivity (Hc) from this B-H plot. Characterizing the operating region of the magnetic component while it operates in a Switch Mode Power Supply (SMPS) under test, provides information concerning the stability of the power supply that was heretofore unavailable.

Abstract: A method and apparatus for measuring inductance. The method and apparatus include processing current and voltage waveform data associated with an inductive device to determine edge and slope parameters for each of a plurality of current waveform data cycles. Furthermore, proportional magnetic flux and proportional magnetic current is determined from the acquired current waveform data and the voltage waveform data proximate determined edge regions of the waveform data. An inductance value of the inductive device may then be calculated from the proportional magnetic flux and proportional magnetic current.

Abstract: A method and apparatus for identifying and analyzing high power dissipation peaks across a switching device. The method and apparatus include processing voltage waveform data associated with a switching device to determine switching edge and slope parameters for each of a plurality of switching cycles, and identifying those portions of the voltage waveform data associated with switch state transition portions of the plurality of switching cycles. For a plurality of the identified switch state transition portions, respective peak power levels are calculated using portions of the voltage waveform data temporally corresponding to the plurality of identified switch state transitions, and portions of current waveform data associated with the switching device temporally corresponding to the plurality of identified switch state transitions.