Patents by Inventor P. Karl Scheller

P. Karl Scheller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210111284
    Abstract: A magnetic field sensor includes a lead frame, a semiconductor die having a first surface in which a magnetic field sensing element is disposed and a second surface attached to the lead frame, and a non-conductive mold material enclosing the die and at least a portion of the lead frame. The sensor may include a ferromagnetic mold material secured to a portion of the non-conductive mold material. Features include a multi-sloped taper to an inner surface of a non-contiguous central region of the ferromagnetic mold material, a separately formed element disposed in the non-contiguous central region, one or more slots in the lead frame, a molded ferromagnetic suppression device spaced from the non-conductive mold material and enclosing a portion of a lead, a passive device spaced from the non-conductive mold material and coupled to a plurality of leads, and a ferromagnetic bead coupled to a lead.
    Type: Application
    Filed: December 22, 2020
    Publication date: April 15, 2021
    Applicant: Allegro MicroSystems, LLC
    Inventors: Ravi Vig, William P. Taylor, Paul A. David, P. Karl Scheller, Andreas P. Friedrich
  • Publication number: 20210048456
    Abstract: A monitor circuit for monitoring a level of a first and second regulated source may monitor a voltage level of regulated voltages or a current level of regulated currents. In an embodiment, the monitor circuit includes circuitry responsive to a first regulated current and to a second regulated current. A first circuit responsive to the first regulated current and to the second regulated current generates a first error signal indicative of at least one of an overcurrent condition of the first regulated current and an undercurrent condition of the second regulated current. A second circuit responsive to the first regulated current and to the second regulated current generates a second error signal indicative of at least one of an undercurrent condition of the first regulated current and an overcurrent condition of the second regulated current. A method for monitoring the levels of first and second regulated sources is also provided.
    Type: Application
    Filed: October 2, 2020
    Publication date: February 18, 2021
    Applicant: Allegro MicroSystems, LLC
    Inventors: Sam Tran, Jay M. Towne, P. Karl Scheller
  • Patent number: 10916665
    Abstract: A magnetic field sensor includes a lead frame, a semiconductor die having a first surface in which a magnetic field sensing element is disposed and a second surface attached to the lead frame, and a non-conductive mold material enclosing the die and at least a portion of the lead frame. The sensor may include a ferromagnetic mold material secured to a portion of the non-conductive mold material. Features include a multi-sloped taper to an inner surface of a non-contiguous central region of the ferromagnetic mold material, a separately formed element disposed in the non-contiguous central region, one or more slots in the lead frame, a molded ferromagnetic suppression device spaced from the non-conductive mold material and enclosing a portion of a lead, a passive device spaced from the non-conductive mold material and coupled to a plurality of leads, and a ferromagnetic bead coupled to a lead.
    Type: Grant
    Filed: January 21, 2019
    Date of Patent: February 9, 2021
    Assignee: Allegro MicroSystems, LLC
    Inventors: Ravi Vig, William P. Taylor, Paul A. David, P. Karl Scheller, Andreas P. Friedrich
  • Publication number: 20200379061
    Abstract: Systems, methods, and apparatuses for magnetic field sensors with self-test include a detection circuit to detect speed and direction of a target. One or more circuits to test accuracy of the detected speed and direction may be included. One or more circuits to test accuracy of an oscillator may also be included. One or more circuits to test the accuracy of an analog-to-digital converter may also be included. Additionally, one or more IDDQ and/or built-in-self test (BIST) circuits may be included.
    Type: Application
    Filed: August 17, 2020
    Publication date: December 3, 2020
    Applicant: Allegro MicroSystems, LLC
    Inventors: P. Karl Scheller, James E. Burgess, Steven E. Snyder, Kristann L. Moody, Devon Fernandez, Andrea Foletto
  • Patent number: 10837987
    Abstract: A monitor circuit for monitoring a level of a first and second regulated source may monitor a voltage level of regulated voltages or a current level of regulated currents. In an embodiment, the monitor circuit includes circuitry responsive to a first regulated voltage and to a second regulated voltage. A first circuit responsive to the first regulated voltage and to the second regulated voltage generates a first error signal indicative of at least one of an overvoltage condition of the first regulated voltage and an undervoltage condition of the second regulated voltage. A second circuit responsive to the first regulated voltage and to the second regulated voltage generates a second error signal indicative of at least one of an undervoltage condition of the first regulated voltage and an overvoltage condition of the second regulated voltage. A method for monitoring the levels of first and second regulated sources is also provided.
    Type: Grant
    Filed: December 26, 2018
    Date of Patent: November 17, 2020
    Assignee: Allegro MicroSystems, LLC
    Inventors: Sam Tran, Jay M. Towne, P. Karl Scheller
  • Patent number: 10782363
    Abstract: Systems, methods, and apparatuses for magnetic field sensors with self-test include a detection circuit to detect speed and direction of a target. One or more circuits to test accuracy of the detected speed and direction may be included. One or more circuits to test accuracy of an oscillator may also be included. One or more circuits to test the accuracy of an analog-to-digital converter may also be included. Additionally, one or more IDDQ and/or built-in-self test (BIST) circuits may be included.
    Type: Grant
    Filed: November 17, 2017
    Date of Patent: September 22, 2020
    Assignee: Allegro MicroSystems, LLC
    Inventors: P. Karl Scheller, James E. Burgess, Steven E. Snyder, Kristann L. Moody, Devon Fernandez, Andrea Foletto
  • Patent number: 10598514
    Abstract: In one aspect, an integrated circuit (IC) includes a magnetic field sensor to detect speed and direction of angular rotation of a rotating magnetic structure. The magnetic field sensor includes at least two magnetic field sensing elements configured to sense changes in a magnetic field caused by rotation of the magnetic structure. The IC also includes an output port configured to provide an output signal of the magnetic field sensor. The output signal indicates the speed and one of the direction or a fault.
    Type: Grant
    Filed: July 20, 2017
    Date of Patent: March 24, 2020
    Assignee: Allegro MicroSystems, LLC
    Inventors: Gary T. Pepka, P. Karl Scheller
  • Patent number: 10571301
    Abstract: In one aspect, an integrated circuit (IC) includes a magnetic field sensor to detect speed and direction of angular rotation of a rotating magnetic structure. The magnetic field sensor includes at least two magnetic field sensing elements configured to sense changes in a magnetic field caused by rotation of the magnetic structure. The IC also includes an output port configured to provide an output signal of the magnetic field sensor. The frequency of the output signal indicates the speed and the direction or indicates a fault.
    Type: Grant
    Filed: July 20, 2017
    Date of Patent: February 25, 2020
    Assignee: Allegro MicroSystems, LLC
    Inventors: Michael C. Doogue, P. Karl Scheller
  • Patent number: 10473486
    Abstract: In one aspect, an integrated circuit (IC) includes a magnetic field sensor to detect speed and direction of angular rotation of a rotating magnetic structure. The magnetic field sensor includes at least two magnetic field sensing elements configured to sense changes in a magnetic field caused by rotation of the magnetic structure. The IC also includes an output port configured to provide an output signal of the magnetic field sensor. A duty cycle percentage of the output signal indicates the speed and the direction or indicates a fault.
    Type: Grant
    Filed: July 20, 2017
    Date of Patent: November 12, 2019
    Assignee: Allegro MicroSystems, LLC
    Inventors: Michael C. Doogue, P. Karl Scheller
  • Patent number: 10411498
    Abstract: A sensor integrated circuit includes an energy storage device having a first terminal coupled to a functional circuit and a blocking circuit coupled between a power supply pin and the first terminal of the energy storage device. The blocking circuit permits the energy storage device to store energy from an external power supply coupled to the power pin. The first terminal of the energy storage device is inaccessible from outside of the sensor IC. Additional features of the sensor IC can include a high regulator, a low regulator, and a low power circuit.
    Type: Grant
    Filed: September 19, 2016
    Date of Patent: September 10, 2019
    Assignee: Allegro MicroSystems, LLC
    Inventors: Eric G. Shoemaker, P. Karl Scheller, Devon Fernandez
  • Publication number: 20190157465
    Abstract: A magnetic field sensor includes a lead frame, a semiconductor die having a first surface in which a magnetic field sensing element is disposed and a second surface attached to the lead frame, and a non-conductive mold material enclosing the die and at least a portion of the lead frame. The sensor may include a ferromagnetic mold material secured to a portion of the non-conductive mold material. Features include a multi-sloped taper to an inner surface of a non-contiguous central region of the ferromagnetic mold material, a separately formed element disposed in the non-contiguous central region, one or more slots in the lead frame, a molded ferromagnetic suppression device spaced from the non-conductive mold material and enclosing a portion of a lead, a passive device spaced from the non-conductive mold material and coupled to a plurality of leads, and a ferromagnetic bead coupled to a lead.
    Type: Application
    Filed: January 21, 2019
    Publication date: May 23, 2019
    Applicant: Allegro MicroSystems, LLC
    Inventors: Ravi Vig, William P. Taylor, Paul A. David, P. Karl Scheller, Andreas P. Friedrich
  • Publication number: 20190128930
    Abstract: A monitor circuit for monitoring a level of a first and second regulated source may monitor a voltage level of regulated voltages or a current level of regulated currents. In an embodiment, the monitor circuit includes circuitry responsive to a first regulated voltage and to a second regulated voltage. A first circuit responsive to the first regulated voltage and to the second regulated voltage generates a first error signal indicative of at least one of an overvoltage condition of the first regulated voltage and an undervoltage condition of the second regulated voltage. A second circuit responsive to the first regulated voltage and to the second regulated voltage generates a second error signal indicative of at least one of an undervoltage condition of the first regulated voltage and an overvoltage condition of the second regulated voltage. A method for monitoring the levels of first and second regulated sources is also provided.
    Type: Application
    Filed: December 26, 2018
    Publication date: May 2, 2019
    Applicant: Allegro MicroSystems, LLC
    Inventors: Sam Tran, Jay M. Towne, P. Karl Scheller
  • Patent number: 10254103
    Abstract: A magnetic field sensor for sensing motion of a ferromagnetic object comprises a substrate. The substrate includes first and second major surfaces, each having a width dimension and a length dimension. The magnetic field sensor further comprises a magnet. The magnet includes a first major surface proximate to the substrate, the first major surface of the magnet heaving a width and a length, and a second major surface. The magnetic field sensor further includes first and second magnetic field sensing dements. The first magnetic field sensing element and the second magnetic field sensing element are positioned beyond respective ends of the width of the magnet. The second magnetic field sensing element is substantially farther from the ferromagnetic object than the first magnetic field sensing element. A line passing through the first and second magnetic field sensing elements is perpendicular to the magnet axis.
    Type: Grant
    Filed: July 20, 2017
    Date of Patent: April 9, 2019
    Assignee: Allegro MicroSystems, LLC
    Inventors: William P. Taylor, P. Karl Scheller, Paul A. David
  • Patent number: 10230006
    Abstract: A magnetic field sensor includes a lead frame, a semiconductor die having a first surface in which a magnetic field sensing element is disposed and a second surface attached to the lead frame, and a non-conductive mold material enclosing the die and at least a portion of the lead frame. The sensor may include a ferromagnetic mold material secured to a portion of the non-conductive mold material. An electromagnetic suppressor comprising a ferromagnetic material encloses a passive device spaced from the non-conductive mold material and coupled to a plurality of leads.
    Type: Grant
    Filed: June 9, 2017
    Date of Patent: March 12, 2019
    Assignee: Allegro MicroSystems, LLC
    Inventors: Ravi Vig, William P. Taylor, Paul A. David, P. Karl Scheller, Andreas P. Friedrich
  • Patent number: 10209279
    Abstract: A monitor circuit for monitoring a level of a first and second regulated source may monitor a voltage level of regulated voltages or a current level of regulated currents. In an embodiment, the monitor circuit includes circuitry responsive to a first regulated voltage and to a second regulated voltage. A first circuit responsive to the first regulated voltage and to the second regulated voltage generates a first error signal indicative of at least one of an overvoltage condition of the first regulated voltage and an undervoltage condition of the second regulated voltage. A second circuit responsive to the first regulated voltage and to the second regulated voltage generates a second error signal indicative of at least one of an undervoltage condition of the first regulated voltage and an overvoltage condition of the second regulated voltage. A method for monitoring the levels of first and second regulated sources is also provided.
    Type: Grant
    Filed: June 24, 2015
    Date of Patent: February 19, 2019
    Assignee: ALLEGRO MICROSYSTEMS, LLC
    Inventors: Sam Tran, Jay M. Towne, P. Karl Scheller
  • Publication number: 20190025080
    Abstract: In one aspect, an integrated circuit (IC) includes a magnetic field sensor to detect speed and direction of angular rotation of a rotating magnetic structure. The magnetic field sensor includes at least two magnetic field sensing elements configured to sense changes in a magnetic field caused by rotation of the magnetic structure. The IC also includes an output port configured to provide an output signal of the magnetic field sensor. A duty cycle percentage of the output signal indicates the speed and the direction or indicates a fault.
    Type: Application
    Filed: July 20, 2017
    Publication date: January 24, 2019
    Applicant: Allegro MicroSystems, LLC
    Inventors: Michael C. Doogue, P. Karl Scheller
  • Publication number: 20190025083
    Abstract: In one aspect, an integrated circuit (IC) includes a magnetic field sensor to detect speed and direction of angular rotation of a rotating magnetic structure. The magnetic field sensor includes at least two magnetic field sensing elements configured to sense changes in a magnetic field caused by rotation of the magnetic structure. The IC also includes an output port configured to provide an output signal of the magnetic field sensor. The output signal indicates the speed and one of the direction or a fault.
    Type: Application
    Filed: July 20, 2017
    Publication date: January 24, 2019
    Applicant: Allegro MicroSystems, LLC
    Inventors: Gary T. Pepka, P. Karl Scheller
  • Publication number: 20190025084
    Abstract: In one aspect, an integrated circuit (IC) includes a magnetic field sensor to detect speed and direction of angular rotation of a rotating magnetic structure. The magnetic field sensor includes at least two magnetic field sensing elements configured to sense changes in a magnetic field caused by rotation of the magnetic structure. The IC also includes an output port configured to provide an output signal of the magnetic field sensor. The frequency of the output signal indicates the speed and the direction or indicates a fault.
    Type: Application
    Filed: July 20, 2017
    Publication date: January 24, 2019
    Applicant: Allegro MicroSystems, LLC
    Inventors: Michael C. Doogue, P. Karl Scheller
  • Publication number: 20180088184
    Abstract: Systems, methods, and apparatuses for magnetic field sensors with self-test include a detection circuit to detect speed and direction of a target. One or more circuits to test accuracy of the detected speed and direction may be included. One or more circuits to test accuracy of an oscillator may also be included. One or more circuits to test the accuracy of an analog-to-digital converter may also be included. Additionally, one or more IDDQ and/or built-in-self test (BIST) circuits may be included.
    Type: Application
    Filed: November 17, 2017
    Publication date: March 29, 2018
    Applicant: Allegro MicroSystems, LLC
    Inventors: P. Karl Scheller, James E. Burgess, Steven E. Snyder, Kristann L. Moody, Devon Fernandez, Andrea Foletto
  • Patent number: 9851416
    Abstract: Systems, methods and apparatuses for magnetic field sensors with self-test include a detection circuit to detect speed and direction of a target. One or more circuits to test accuracy of the detected speed and direction may be included. One or more circuits to test accuracy of an oscillator may also be included. One or more circuits to test the accuracy of an analog-to-digital converter may also be included. Additionally one or more IDDQ and/or built-in-self test (BEST) circuits may be included.
    Type: Grant
    Filed: July 22, 2014
    Date of Patent: December 26, 2017
    Assignee: Allegro MicroSystems, LLC
    Inventors: P. Karl Scheller, James E. Burgess, Steven E. Snyder, Kristann L. Moody, Devon Fernandez, Andrea Foletto