Patents by Inventor Pablo Gabolde

Pablo Gabolde has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7817283
    Abstract: Various systems and methods for analysis of optical pulses are provided. In one embodiment, an optical system is provided having an optical axis. The optical system includes a two-dimensional diffraction grating positioned along the optical axis, and a spectral filter positioned along the optical axis after the two-dimensional diffraction grating. The spectral filter is angularly offset about a vertical transverse angle associated with the optical system. The diffraction grating is angularly offset about the optical axis relative to the spectral filter, and an optical capture device positioned after the spectral filter.
    Type: Grant
    Filed: May 17, 2007
    Date of Patent: October 19, 2010
    Assignee: Georgia Tech Research Corporation
    Inventors: Pablo Gabolde, Rick Trebino
  • Patent number: 7817282
    Abstract: Disclosed are an apparatus and methods for determining electric field characteristics of pulses. In one example, a method is provided in which an unknown pulse is propagated through a first optical fiber. A reference pulse is propagated through a second optical fiber. The unknown pulse and the reference pulse are directed out of the first and second optical fibers into a spectrometer. The unknown pulse and the reference pulse propagate along a pair of crossing trajectories through the spectrometer to form an interferogram. The electric field of the unknown pulse is determined by processing this interferogram.
    Type: Grant
    Filed: May 17, 2007
    Date of Patent: October 19, 2010
    Assignee: Georgia Tech Research Corporation
    Inventors: Pamela Bowlan, Pablo Gabolde, Rick Trebino
  • Publication number: 20080285045
    Abstract: Various systems and methods for analysis of optical pulses are provided. In one embodiment, an optical system is provided having an optical axis. The optical system includes a two-dimensional diffraction grating positioned along the optical axis, and a spectral filter positioned along the optical axis after the two-dimensional diffraction grating. The spectral filter is angularly offset about a vertical transverse angle associated with the optical system. The diffraction grating is angularly offset about the optical axis relative to the spectral filter, and an optical capture device positioned after the spectral filter.
    Type: Application
    Filed: May 17, 2007
    Publication date: November 20, 2008
    Applicant: GEORGIA TECH RESEARCH CORPORATION
    Inventors: Pablo Gabolde, Rick Trebino
  • Publication number: 20080285031
    Abstract: Disclosed are an apparatus and methods for determining electric field characteristics of pulses. In one example, a method is provided in which an unknown pulse is propagated through a first optical fiber. A reference pulse is propagated through a second optical fiber. The unknown pulse and the reference pulse are directed out of the first and second optical fibers into a spectrometer. The unknown pulse and the reference pulse propagated along a pair of crossing trajectories through the spectrometer to form an interferogram. The electric field of the unknown pulse is determined by processing this interferogram.
    Type: Application
    Filed: May 17, 2007
    Publication date: November 20, 2008
    Applicant: GEORGIA TECH RESEARCH CORPORATION
    Inventors: Pamela Bowlan, Pablo Gabolde, Rick Trebino