Patents by Inventor Pai-Cheng Huang

Pai-Cheng Huang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130259486
    Abstract: A wireless communication device includes a first antenna, a second antenna, a first light sensor adjacent to the first antenna, a second light sensor adjacent to the second antenna, a controller, and a magnetic member movably located between the first antenna and the second antenna. When one of the first and second antennas in a state of receiving/transmitting wireless signals is covered by a user's hand, the nearby light sensor sends a pulse signal to the controller. The controller receiving the pulse signal controls the first and second antennas to change their magnetic polarity, enabling the magnetic member to be separated from one of the first and second antennas and attached to the another one, thereby choosing one of the first and second antennas, or a combination of one of the two antennas and the magnetic member to receive/transmit the wireless signals.
    Type: Application
    Filed: October 9, 2012
    Publication date: October 3, 2013
    Inventors: CHUAN-CHOU CHI, CHIH-YANG TSAI, PAI-CHENG HUANG, HAO-YING CHANG
  • Patent number: 7382325
    Abstract: A micro stacked type chip antenna, wherein a plurality of elementary layers printed with radiation metallic electrodes are stacked up to allow the radiation metallic electrodes on the elementary layers to electrically connect each with its neighboring ones (one) of the radiation metallic electrodes on its upper one and/or lower one of the elementary layers; and then these elementary layers stacked up are packed in a packing process, a plurality of connecting pins are connected respectively with the radiation metallic electrodes on different elementary layers, the tailing end of each connecting pin is extended out of a packing envelop; by various options of connecting of the connecting pins, resonant frequencies of different band widths can be obtained.
    Type: Grant
    Filed: November 14, 2006
    Date of Patent: June 3, 2008
    Assignee: Auden Techno Corp.
    Inventors: Yu-Shu Chao, Chi-Ming Chiang, Pai-Cheng Huang
  • Publication number: 20080111742
    Abstract: A micro stacked type chip antenna, wherein a plurality of elementary layers printed with radiation metallic electrodes are stacked up to allow the radiation metallic electrodes on the elementary layers to electrically connect each with its neighboring ones (one) of the radiation metallic electrodes on its upper one and/or lower one of the elementary layers; and then these elementary layers stacked up are packed in a packing process, a plurality of connecting pins are connected respectively with the radiation metallic electrodes on different elementary layers, the tailing end of each connecting pin is extended out of a packing envelop; by various options of connecting of the connecting pins, resonant frequencies of different band widths can be obtained.
    Type: Application
    Filed: November 14, 2006
    Publication date: May 15, 2008
    Inventors: Yu-Shu Chao, Chi-Ming Chiang, Pai-Cheng Huang
  • Patent number: 7127314
    Abstract: System and method for monitoring a fabrication process. Generally, an actual-to-planned variance is calculated by determining a daily part index as a percentage of the delta between the planned quantity and the actual quantity over the planned quantity. A weekly part index is calculated by averaging the daily part index over a predetermined time period. From the weekly part index, a site index is determined that takes into account products fabricated at a particular site. Furthermore, a planned-to-actual variance may be calculated by determining a daily part index as a percentage of the delta between the planned quantity and the actual quantity over the actual quantity. A weekly part index is calculated by averaging the daily part index over a predetermined time period. From the weekly part index, a site index is determined that takes into account products fabricated at a particular site.
    Type: Grant
    Filed: March 25, 2004
    Date of Patent: October 24, 2006
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chin-Cheng Pan, Chao-Fan Chang, Pai-Cheng Huang, Oliver Wu
  • Publication number: 20050216113
    Abstract: System and method for monitoring a fabrication process. Generally, an actual-to-planned variance is calculated by determining a daily part index as a percentage of the delta between the planned quantity and the actual quantity over the planned quantity. A weekly part index is calculated by averaging the daily part index over a predetermined time period. From the weekly part index, a site index is determined that takes into account products fabricated at a particular site. Furthermore, a planned-to-actual variance may be calculated by determining a daily part index as a percentage of the delta between the planned quantity and the actual quantity over the actual quantity. A weekly part index is calculated by averaging the daily part index over a predetermined time period. From the weekly part index, a site index is determined that takes into account products fabricated at a particular site.
    Type: Application
    Filed: March 25, 2004
    Publication date: September 29, 2005
    Inventors: Chin-Cheng Pan, Chao-Fan Chang, Pai-Cheng Huang, Oliver Wu
  • Publication number: 20050216112
    Abstract: A system for manufacturing scheduling for a fabrication system. The fabrication contains a plurality of tool groups, and each of which has at least one tool. The system contains an input/output device, a processor, and a storage device. The processor calculates the tool group count of each tool, and assigns a preference index to each tool accordingly, then derives a preference-based manufacturing schedule.
    Type: Application
    Filed: March 26, 2004
    Publication date: September 29, 2005
    Inventors: Pai-Cheng Huang, Ming-Feng Ou
  • Patent number: 6941183
    Abstract: A system for manufacturing scheduling for a fabrication system. The fabrication contains a plurality of tool groups, and each of which has at least one tool. The system contains an input/output device, a processor, and a storage device. The processor calculates the tool group count of each tool, and assigns a preference index to each tool accordingly, then derives a preference-based manufacturing schedule.
    Type: Grant
    Filed: March 26, 2004
    Date of Patent: September 6, 2005
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Pai-Cheng Huang, Ming-Feng Ou