Patents by Inventor Pak Chan

Pak Chan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260128803
    Abstract: In some implementations, a network test device may apply a first calibration scheme to a transceiver array of the network test device using a first calibration signal, wherein the first calibration scheme is to measure a relative frequency response between transceivers of the transceiver array and remove errors associated with the relative frequency response, where the relative frequency response is associated with an amplitude and a phase. The network test device may apply a second calibration scheme to the transceiver array using a second calibration signal, wherein the second calibration scheme is to remove changes in the relative frequency response, where the changes in the relative frequency response are associated with changes in the amplitude and in the phase. The network test device may evaluate a wireless base station using the transceiver array that is calibrated based on the first calibration scheme and the second calibration scheme.
    Type: Application
    Filed: December 29, 2025
    Publication date: May 7, 2026
    Inventors: Pablo PEREZ LARA, Pak CHAN, Martyn Peter BINGE, Ian Detek CAIRNS
  • Patent number: 12556291
    Abstract: In some implementations, a network test device may apply a first calibration scheme to a transceiver array of the network test device using a first calibration signal, wherein the first calibration scheme is to measure a relative frequency response between transceivers of the transceiver array and remove errors associated with the relative frequency response, where the relative frequency response is associated with an amplitude and a phase. The network test device may apply a second calibration scheme to the transceiver array using a second calibration signal, wherein the second calibration scheme is to remove changes in the relative frequency response, where the changes in the relative frequency response are associated with changes in the amplitude and in the phase. The network test device may evaluate a wireless base station using the transceiver array that is calibrated based on the first calibration scheme and the second calibration scheme.
    Type: Grant
    Filed: June 28, 2024
    Date of Patent: February 17, 2026
    Assignee: VIAVI Solutions Inc.
    Inventors: Pablo Perez Lara, Pak Chan, Martyn Peter Binge, Ian Derek Cairns
  • Publication number: 20260005775
    Abstract: In some implementations, a network test device may apply a first calibration scheme to a transceiver array of the network test device using a first calibration signal, wherein the first calibration scheme is to measure a relative frequency response between transceivers of the transceiver array and remove errors associated with the relative frequency response, where the relative frequency response is associated with an amplitude and a phase. The network test device may apply a second calibration scheme to the transceiver array using a second calibration signal, wherein the second calibration scheme is to remove changes in the relative frequency response, where the changes in the relative frequency response are associated with changes in the amplitude and in the phase. The network test device may evaluate a wireless base station using the transceiver array that is calibrated based on the first calibration scheme and the second calibration scheme.
    Type: Application
    Filed: June 28, 2024
    Publication date: January 1, 2026
    Inventors: Pablo PEREZ LARA, Pak CHAN, Martyn Peter BINGE, Ian Derek CAIRNS
  • Publication number: 20070109056
    Abstract: In one embodiment, a current source circuit having a reference resistor produces first, second and third bias currents that vary with manufacturing variances of the current compensation resistor. An input amplification stage includes a transconductance stage biased by the first bias current, a first transimpedance amplifier (TIA) biased by the second bias current, and a first feedback resistor coupled between the first TIA's input and output. The input of the first TIA is coupled to an output of the transconductance stage. An output amplification stage is biased by the third bias current and has an input coupled to an output of the first TIA. A second feedback resistor is coupled between the output of the output amplification stage and the input of the transconductance stage. The reference resistor and first and second feedback resistors are formed using a common manufacturing process.
    Type: Application
    Filed: November 17, 2005
    Publication date: May 17, 2007
    Inventors: Hock Kwa, Xue Ji, Bin Zhang, Pak Chan
  • Publication number: 20050142256
    Abstract: A first pattern (64) of candy beads (14) is picked up by use of a vacuum carrier (54) and is positioned on a region of the upper surface of a sheet candy member (12). The vacuum is turned off and the vacuum carrier (54) is moved away from the sheet candy member (12) leaving the pattern (64) of candy beads (14) on the sheet candy member (12). This procedure is repeated at least once, and preferably two more times, providing an additional pattern or pattern of different colored candy beads (16, 18) on the upper surface of the base candy member (12). The color of the base candy member (12) and the color of the different candy beads (14, 16, 18) together form a picture or a design on the sheet candy member (12).
    Type: Application
    Filed: December 30, 2003
    Publication date: June 30, 2005
    Inventor: Pak Chan