Abstract: A semiconductor testing handler includes a chamber, at least one chuck attached within the chamber, and a plurality of heating elements disposed to place heat into the chamber. The semiconductor testing handler also includes an air handler disposed to move air through the chamber, and at least one temperature sensor positioned on the inside of the chamber. The semiconductor testing handler also has a control mechanism. A signal from the at least one temperature sensor is input to the control mechanism. The control mechanism controls the plurality of heating elements and the air handler to control the temperature of the chamber.