Patents by Inventor Palak Valecha

Palak Valecha has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260086796
    Abstract: Systems and methods for bias testing and remediation are disclosed. Decentralized Web Application Testing Systems use a Holochain framework to distribute testing workloads across Full Nodes and Lightning Nodes. A Holochain Node Management Application for configuring nodes, a UI Application creates test cases, and a Version Management System tracks changes. Test results are stored and analyzed in a Test Result Store, with a Bias Intelligence module detecting biases and generating additional test cases. A Consensus Algorithm validates test cases through decentralized nomination. An AI-Driven Defect Remediation System automates defect detection, root cause analysis, and remediation using AI modules. Machine learning algorithms identify patterns and anomalies, while NLP techniques generate code fixes. Predictive maintenance monitors application performance to preemptively address issues. A feedback loop mechanism continuously improves AI models through reinforcement learning.
    Type: Application
    Filed: September 25, 2024
    Publication date: March 26, 2026
    Inventors: Jeonghoon Lee, Yogi Ahuja, Nagrajeshwari Vernekar, Ayyappan Thirukkannan, Nishit Jain, Dhivya Sena Jeyaram Mohan, Palak Valecha, Deelip Bandarkar, Silpa Mokkapati, Veena Kedia, Subhashish Panda, Prabhakar Devisetty, Vikas Kumar
  • Publication number: 20260086928
    Abstract: Systems and methods for bias testing and remediation are disclosed. Decentralized Web Application Testing Systems use a Holochain framework to distribute testing workloads across Full Nodes and Lightning Nodes. A Holochain Node Management Application for configuring nodes, a UI Application creates test cases, and a Version Management System tracks changes. Test results are stored and analyzed in a Test Result Store, with a Bias Intelligence module detecting biases and generating additional test cases. A Consensus Algorithm validates test cases through decentralized nomination. An AI-Driven Defect Remediation System automates defect detection, root cause analysis, and remediation using AI modules. Machine learning algorithms identify patterns and anomalies, while NLP techniques generate code fixes. Predictive maintenance monitors application performance to preemptively address issues. A feedback loop mechanism continuously improves AI models through reinforcement learning.
    Type: Application
    Filed: September 25, 2024
    Publication date: March 26, 2026
    Inventors: Jeonghoon Lee, Yogi Ahuja, Nagrajeshwari Vernekar, Ayyappan Thirukkannan, Nishit Jain, Dhivya Sena Jeyaram Mohan, Palak Valecha, Deelip Bandarkar, Silpa Mokkapati, Veena Kedia, Subhashish Panda, Prabhakar Devisetty, Vikas Kumar