Patents by Inventor Pam Cavanagh

Pam Cavanagh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for detecting defects in a material and a system for accomplishing the same
    Patent number: 6870950
    Abstract: The present invention provides a method for detecting defects in a material and a system for accomplishing the same. The method includes obtaining an image of at least a portion of a material's surface and converting the image into an intensity profile. The method further includes determining a defect in the material's surface from the intensity profile. In one exemplary embodiment, the image is an electron image obtained using a scanning electron microscope. The method may further be used to determine a defect density in the material's surface.
    Type: Grant
    Filed: March 15, 2001
    Date of Patent: March 22, 2005
    Assignee: Agere Systems Inc.
    Inventors: Erik C. Houge, Catherine Vartuli, Mike Antonell, Pam Cavanagh, Hui Ma
  • Method for detecting defects in a material and a system for accomplishing the same
    Publication number: 20020131631
    Abstract: The present invention provides a method for detecting defects in a material and a system for accomplishing the same. The method includes obtaining an image of at least a portion of a material's surface and converting the image into an intensity profile. The method further includes determining a defect in the material's surface from the intensity profile. In one exemplary embodiment, the image is an electron image obtained using a scanning electron microscope. The method may further be used to determine a defect density in the material's surface.
    Type: Application
    Filed: March 15, 2001
    Publication date: September 19, 2002
    Inventors: Erik C. Houge, Catherine Vartuli, Mike Antonell, Pam Cavanagh, Hui Ma