Abstract: A method and system for monitoring laser shock peening of a work piece. A line spectrum is obtained from radiation emitted by a plasma produced by a laser shock peening process. The shape of the line spectrum about its emission peak is compared to a defined line shape to verify proper operation of the laser shock peening process. The line shape may be a Lorentzian line shape corresponding to a desired line shape. The line shape may a Gaussian line shape corresponding to an undesired line shape. The system can also detect the failure mode that occurs when the opaque layer is broken through by detecting the plasma spectral component produced by the work piece material, along with the plasma produced by the opaque layer.

Abstract: In in-situ laser plasma spectroscopy (LPS) apparatus includes an enclosure for housing a laser energy source and associated signal coupling optics. A main fiber is attached to the enclosure at a first end of the main fiber, and attached to a probe at a second end of the main fiber. The main fiber is configured for transmitting input laser energy from the laser energy source to a target and for transmitting laser induced plasma emission signals back from the target. The probe has a single focal lens for directing the input laser energy from the main fiber to the target, and for directing the laser induced plasma emission signals from the target to the main fiber.

Abstract: A method and system for monitoring laser shock peening of a work piece. A line spectrum is obtained from radiation emitted by a plasma produced by a laser shock peening process. The shape of the line spectrum about its emission peak is compared to a defined line shape to verify proper operation of the laser shock peening process. The line shape may be a Lorentzian line shape corresponding to a desired line shape. The line shape may a Gaussian line shape corresponding to an undesired line shape. The system can also detect the failure mode that occurs when the opaque layer is broken through by detecting the plasma spectral component produced by the work piece material, along with the plasma produced by the opaque layer.

Abstract: In in-situ laser plasma spectroscopy (LPS) apparatus includes an enclosure for housing a laser energy source and associated signal coupling optics. A main fiber is attached to the enclosure at a first end of the main fiber, and attached to a probe at a second end of the main fiber. The main fiber is configured for transmitting input laser energy from the laser energy source to a target and for transmitting laser induced plasma emission signals back from the target. The probe has a single focal lens for directing the input laser energy from the main fiber to the target, and for directing the laser induced plasma emission signals from the target to the main fiber.

Abstract: A portable Laser Plasma Spectroscopy (LPS) system and process is provided for performing in situ, near-real time, remote elemental analysis and identification of deposits or other foreign material found on surfaces of machine parts, such as turbine compressor blades or the like, wherein identification of the elemental constituents of a particular deposit is obtained without incurring significant ablative damage to the machine part substrate material underlying the deposit.

Abstract: A portable Laser Plasma Spectroscopy (LPS) system and process is provided for performing in situ, near-real time, remote elemental analysis and identification of deposits or other foreign material found on surfaces of machine parts, such as turbine compressor blades or the like, wherein identification of the elemental constituents of a particular deposit is obtained without incurring significant ablative damage to the machine part substrate material underlying the deposit.