Abstract: The present application relates to an array substrate, a display panel and a display device, in which the array substrate comprises a substrate, routing lines, a pixel driving electrode and a thin film transistor. The routing lines are arranged on the substrate, and the routing lines include a first routing line. The pixel driving electrode is arranged on the substrate. The thin film transistor is arranged on the substrate and connected to the routing lines and the pixel driving electrode each. The thin film transistor comprises an active layer and a gate that are stacked, the gate is electrically connected to the first routing line and comprises a first gate portion, a second gate portion and a connecting line arranged in a same layer.

Abstract: A display panel and a display device are provided. The display panel includes: a display region, a non-display region, and multiple drive signal lines. A fanout region and a connection terminal region are disposed in the non-display region. Multiple fanout wires are arranged in the fanout region. Multiple connection terminals are arranged in the connection terminal region. The fanout wires include a first fanout wire and a second fanout wire. The first fanout wire includes a first wire segment. The first wire segment has a width different from the width of the second fanout wire. The length of the first wire segment is equal to at least a portion of the length of the first fanout wire.

Abstract: An array substrate, a method for manufacturing an array substrate, a display panel and a display device are provided. The array substrate includes a substrate; an insulating layer arranged at a side of the substrate, where the insulating layer is provided with an opening, the insulating layer includes a first area and a second area, a thickness of the first area is less than a thickness of the second area, and the first area is arranged around at least a part of the opening; and a first conductive part arranged at a side of the insulating layer away from the substrate, where an orthographic projection of the first conductive part on the substrate and an orthographic projection of the first area on the substrate are at least partially overlapped.

Abstract: The disclosure relates to the field of measurement and calibration of capacitance, especially the instrument of transferring capacitance. A wide range capacitor standard box comprises a chassis, 36 physical capacitors, and 4 changeover switches. Output ports are on the front panel of the chassis. 4 dial-switches select the output capacitance in values of 1, 2, 5 times of single-unit capacitance. The changeover switch has input terminals that connect to two electrodes of the physical capacitors, and output terminals that connect to the output ports. Comparing to decade capacitor standard boxes, the present box realizes capacitance outputs from 1 pF˜500 mF in values of 1, 2, 5 times of single-unit capacitance. The present box significantly extends the measurement range of capacitance, and makes the capacitor standard box smaller and lighter. By introducing a compensation function for open and short circuits, it is convenient and suitable for precision measurement.

Abstract: The invention disclosed a high precision decade capacitor standard box. It comprises 6 sets of physical capacitors, 6 changeover switches, and output ports. Each set of physical capacitors include 4 physical capacitors, at least one capacitor has single-unit capacitance. The changeover switch implements the decade encoding of all the combinations of 4 physical capacitors. The changeover switch has input terminals that connect to two electrodes of physical capacitors, and output terminals that connect to the output ports of capacitor standard box to provide the selected capacitance. The capacitance values can be selected any integer from 0 to 10 times of single-unit capacitance. The decade encoding of all the combinations of 4 capacitors can reduce the number of required capacitors and wires for connecting capacitors. The open and short compensation are adopted in this decade capacitor standard, which minimizes error, improve accuracy, and is convenient for measurement, transport, and field application.

Abstract: The disclosure relates to the field of measurement and calibration of capacitance, especially the instrument of transferring capacitance. A wide range capacitor standard box comprises a chassis, 36 physical capacitors, and 4 changeover switches. Output ports are on the front panel of the chassis. 4 dial-switches select the output capacitance in values of 1, 2, 5 times of single-unit capacitance. The changeover switch has input terminals that connect to two electrodes of the physical capacitors, and output terminals that connect to the output ports. Comparing to decade capacitor standard boxes, the present box realizes capacitance outputs from 1 pF˜500 mF in values of 1, 2, 5 times of single-unit capacitance. The present box significantly extends the measurement range of capacitance, and makes the capacitor standard box smaller and lighter. By introducing a compensation function for open and short circuits, it is convenient and suitable for precision measurement.

Abstract: The invention disclosed a high precision decade capacitor standard box. It comprises 6 sets of physical capacitors, 6 changeover switches, and output ports. Each set of physical capacitors include 4 physical capacitors, at least one capacitor has single-unit capacitance. The changeover switch implements the decade encoding of all the combinations of 4 physical capacitors. The changeover switch has input terminals that connect to two electrodes of physical capacitors, and output terminals that connect to the output ports of capacitor standard box to provide the selected capacitance. The capacitance values can be selected any integer from 0 to 10 times of single-unit capacitance. The decade encoding of all the combinations of 4 capacitors can reduce the number of required capacitors and wires for connecting capacitors. The open and short compensation are adopted in this decade capacitor standard, which minimizes error, improve accuracy, and is convenient for measurement, transport, and field application.

Abstract: A standard inductance box, relating to the fields of measurement or calibration, and relating in particular to a standard gauge for transferring an inductance parameter. The standard inductance box uses unary, binary and quinary, and comprises a physical inductance box section and a simulated inductance box section, said sections being respectively arranged in a metal box. Electrodes of the physical inductance box section and the simulated inductance box section are led out. The inductance range of the standard inductance box is 1 ?H-500 H. The described means achieve an inductance range of 1 ?H-500 H, expanding the inductance range in the prior art, and the application of a simulated inductance box. Using unary, binary and quinary standards reduces the size and weight of the physical inductance box section, facilitating transportation and use in the field.

Abstract: A standard inductance box, relating to the fields of measurement or calibration, and relating in particular to a standard gauge for transferring an inductance parameter. The standard inductance box uses unary, binary and quinary, and comprises a physical inductance box section and a simulated inductance box section, said sections being respectively arranged in a metal box. Electrodes of the physical inductance box section and the simulated inductance box section are led out. The inductance range of the standard inductance box is 1 ?H-500 H. The described means achieve an inductance range of 1 ?H-500 H, expanding the inductance range in the prior art, and the application of a simulated inductance box. Using unary, binary and quinary standards reduces the size and weight of the physical inductance box section, facilitating transportation and use in the field.