Patents by Inventor Paola Zepeda

Paola Zepeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8314725
    Abstract: In one embodiment, an analog-to-digital conversion in an integrated circuit is evaluated by an on-die testing circuit. For example, the on-die test circuit 370 can characterize one or both of the linearity and monotonicity of the digital-to-analog conversion. The value of a conversion output for a digital input code may be compared to the value of a prior conversion output of a prior step to provide digital difference values for each step of a sweep of digital input codes. Digital difference values may be compared to one or more predetermined limits to provide one or more pass/fail tests on-board the die. Other embodiments are described and claimed.
    Type: Grant
    Filed: September 15, 2010
    Date of Patent: November 20, 2012
    Assignee: Intel Corporation
    Inventors: Paola Zepeda, David E. Duarte, Gregory F. Taylor, Atul Maheshwari
  • Publication number: 20120062401
    Abstract: In one embodiment, an analog-to-digital conversion in an integrated circuit is evaluated by an on-die testing circuit. For example, the on-die test circuit 370 can characterize one or both of the linearity and monotonicity of the digital-to-analog conversion. The value of a conversion output for a digital input code may be compared to the value of a prior conversion output of a prior step to provide digital difference values for each step of a sweep of digital input codes. Digital difference values may be compared to one or more predetermined limits to provide one or more pass/fail tests on-board the die. Other embodiments are described and claimed.
    Type: Application
    Filed: September 15, 2010
    Publication date: March 15, 2012
    Inventors: Paola ZEPEDA, David E. DUARTE, Gregory F. TAYLOR, Atul MAHESHWARI