Abstract: Methods, systems, and devices for operating a memory cell or cells are described. An error in stored data may be detected by an error correction code (ECC) operation during sensing of the memory cells used to store the data. The error may be indicated in hardware by generating a measurable signal on an output node. For example, the voltage at the output node may be changed from a first value to a second value. A device monitoring the output node may determine an error has occurred for a set of data based at least in part on the change in the signal at the output node.

Abstract: Serial peripheral interfaces and methods of operating the same are provided. An apparatus can have a serial peripheral interface (SPI) including a first command state machine (CSM), and a second CSM.

Abstract: Methods, systems, and devices for operating a memory cell or cells are described. An error in stored data may be detected by an error correction code (ECC) operation during sensing of the memory cells used to store the data. The error may be indicated in hardware by generating a measurable signal on an output node. For example, the voltage at the output node may be changed from a first value to a second value. A device monitoring the output node may determine an error has occurred for a set of data based at least in part on the change in the signal at the output node.

Abstract: Methods, systems, and devices for operating a memory cell or cells are described. An error in stored data may be detected by an error correction code (ECC) operation during sensing of the memory cells used to store the data. The error may be indicated in hardware by generating a measurable signal on an output node. For example, the voltage at the output node may be changed from a first value to a second value. A device monitoring the output node may determine an error has occurred for a set of data based at least in part on the change in the signal at the output node.

Abstract: Methods, systems, and devices for operating a memory cell or cells are described. An error in stored data may be detected by an error correction code (ECC) operation during sensing of the memory cells used to store the data. The error may be indicated in hardware by generating a measurable signal on an output node. For example, the voltage at the output node may be changed from a first value to a second value. A device monitoring the output node may determine an error has occurred for a set of data based at least in part on the change in the signal at the output node.

Abstract: Methods, systems, and devices for operating a memory cell or cells are described. An error in stored data may be detected by an error correction code (ECC) operation during sensing of the memory cells used to store the data. The error may be indicated in hardware by generating a measurable signal on an output node. For example, the voltage at the output node may be changed from a first value to a second value. A device monitoring the output node may determine an error has occurred for a set of data based at least in part on the change in the signal at the output node.

Abstract: Methods, systems, and devices for operating a memory cell or cells are described. An error in stored data may be detected by an error correction code (ECC) operation during sensing of the memory cells used to store the data. The error may be indicated in hardware by generating a measurable signal on an output node. For example, the voltage at the output node may be changed from a first value to a second value. A device monitoring the output node may determine an error has occurred for a set of data based at least in part on the change in the signal at the output node.

Abstract: Serial peripheral interfaces and methods of operating the same are provided. An apparatus can have a serial peripheral interface (SPI) including a first command state machine (CSM), and a second CSM.

Abstract: Serial peripheral interfaces and methods of operating the same are provided. An apparatus can have a serial peripheral interface (SPI) including a first command state machine (CSM), and a second CSM.

Abstract: Methods and apparatuses for calibrating data sampling points are disclosed herein. An example apparatus may include a memory that may be configured to receive a calibration command and an attribute. The memory may include a first register that is configured to store a tuning data pattern and a second register that is configured to receive and store the tuning data pattern stored in the first register. The second register may be further configured to store the tuning data pattern responsive, at least in part, to the memory receiving the calibration command. The memory may be configured to execute an operation on at least one of the tuning data pattern stored in the first register or the tuning data pattern stored in the second register based, at least in part, on the attribute.

Abstract: Serial peripheral interfaces and methods of operating the same are provided. An apparatus can have a serial peripheral interface (SPI) including a first command state machine (CSM), and a second CSM.

Abstract: Methods and apparatuses for calibrating data sampling points are disclosed herein. An example apparatus may include a memory that may be configured to receive a calibration command and an attribute. The memory may include a first register that is configured to store a tuning data pattern and a second register that is configured to receive and store the tuning data pattern stored in the first register. The second register may be further configured to store the tuning data pattern responsive, at least in part, to the memory receiving the calibration command. The memory may be configured to execute an operation on at least one of the tuning data pattern stored in the first register or the tuning data pattern stored in the second register based, at least in part, on the attribute.