Abstract: Techniques for the testing of devices are disclosed. A testing environment is accessed. The testing environment includes an instruction RAM, an instruction fetch and decode unit (FAD), a code exerciser, a command interface, and a trace RAM. A device under test (DUT) is accessible by the command interface. The testing environment includes a test instruction set architecture (TISA). A test sequence is programmed by a user. The test sequence includes one or more instructions from within the TISA. The test sequence is stored in the instruction RAM. A first instruction is fetched by the FAD. The fetching includes decoding the first instruction. The first instruction is translated by the code exerciser. The translating produces a first packetized communication, which is sent to the DUT. A first packetized response is received by the command interface from the DUT and is reported to the user.

Abstract: Techniques for interfacing electronics are disclosed. A system-on-chip is accessed. The system-on-chip includes a network-on-chip (NoC) topology. The NoC sub-topologies are based on a physical location of the plurality of logic blocks. A first sub-topology is coupled to a receiving block, wherein the coupling includes inserting an interfacing block. The interfacing block includes a digital PLL (DPLL). The first sub-topology sends to the interfacing block data and a first clock. The first clock is input to the DPLL and used as a reference clock. The DPLL generates a second clock that is used to save the data that was sent. The interfacing block forwards to the receiving block the second clock and the data that was saved. The second clock is used as the internal clock in the receiving sub-topology. The NoC communications includes packets. Additional interfacing blocks are instantiated as necessary.

Abstract: Testing techniques are disclosed. A test environment is accessed. The test environment includes a trace encoder and a software device-under-test interface (SDI). The SDI is coupled to a device-under-test (DUT). Software access points are inserted into the SDI to allow observability of one or more internal signals within the SDI. Modification instructions that cause the SDI to autonomously alter a response to the DUT are programmed into the SDI. The modification instructions are based on a test instruction set architecture. A test sequence is sent to the SDI, causing communications with the device under test. Replies are received from the DUT. The SDI responds to the replies and sends additional communications to the device under test. Additional replies are obtained from the DUT. A trace encoder creates a logic trace comprised of the states of the software access points.

Abstract: Built-in self-test (BIST) execution is enabled in various applications, including embedded systems, such as those found in vehicles, medical equipment, avionics, and/or other systems of critical importance. An automotive subsystem within a motor vehicle is accessed. The automotive subsystem includes a system-on-a-chip (SoC). The SoC includes a network-on-a-chip (NoC). The SoC is coupled to a communications bus. The communications bus includes a bus controller. The SoC is coupled to a functional safety test environment (FUSATE). The FUSATE is awakened from a low power mode by a timer. The FUSATE a test sequence to one or more logic components within the SOC. The test sequence includes a functionality check of the one or more logic components. The FUSATE receives a first response from the one or more logic components within the SoC and records the first response. The FUSATE reenters the low power mode, resetting the timer.

Abstract: Techniques for the testing of devices are disclosed. A testing environment is accessed. The testing environment includes an instruction RAM, an instruction fetch and decode unit (FAD), a code exerciser, a command interface, and a trace RAM. A device under test (DUT) is accessible by the command interface. The testing environment includes a test instruction set architecture (TISA). A test sequence is programmed by a user. The test sequence includes one or more instructions from within the TISA. The test sequence is stored in the instruction RAM. A first instruction is fetched by the FAD. The fetching includes decoding the first instruction. The first instruction is translated by the code exerciser. The translating produces a first packetized communication, which is sent to the DUT. A first packetized response is received by the command interface from the DUT and is reported to the user.

Abstract: Disclosed embodiments provide techniques for a networking with a network-on-chip (NoC) interface with subtopologies. A system-on-chip (SoC) is accessed. The SoC includes a plurality of logic blocks. A NoC topology is created. The NoC topology includes one or more subtopologies. The one or more subtopologies are based on a physical location of the plurality of logic blocks. Each subtopology includes at least one router. A location of the one or more subtopologies is optimized. The one or more subtopologies are coupled based on one or more communications protocols. A protocol running on the plurality of logic blocks is translated to the one or more communications protocols. Data is sent from a sending subtopology within the one or more subtopologies to a receiving subtopology within the one or more subtopologies.

Abstract: New metered-dosing compositions and methods of use comprising at least one psychedelic compound derived from living organisms such as plants and fungi, synthetically-derived forms or synthetic analogue. The composition for use in metered-dosing administration modalities, including a nasal spray, pressurized metered-dose inhaler, etc.