Patents by Inventor Parag Prakash Wagaj

Parag Prakash Wagaj has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230408252
    Abstract: A multi-axis system (30) for positioning a workpiece measuring sensor (54) on a metrology machine. Preferably, each sensor is positionable via a system comprising movement along and/or about at least linear directions/axes (X, Z, A, B) so as to control linear and/or rotational movement of a sensor automatically to a predetermined position without operator intervention. The multi-axis positioning system allows faster setup times when a workpiece or tooling on a machine is changed.
    Type: Application
    Filed: November 16, 2021
    Publication date: December 21, 2023
    Inventors: Parag Prakash Wagaj, Ethan James Shepherd, Michael R. Tanner, Edward J. Damron, Douglas Charles Beerck
  • Patent number: 11262190
    Abstract: A method and machine comprising at least one non-contact sensor (52) on a functional testing platform (50) for workpiece inspection and/or measurement. The inclusion of at least one non-contact sensor on the functional testing platform results in the combination of two machine platforms into a single machine and provides the user with measurement characteristics of both methods, functional and analytical, saving significant cycle time and significant space.
    Type: Grant
    Filed: October 23, 2018
    Date of Patent: March 1, 2022
    Assignee: GLEASON METROLOGY SYSTEMS CORPORATION
    Inventors: Parag Prakash Wagaj, Douglas Charles Beerck, Ethan James Shepherd, Michael R. Tanner, Edward J. Damron, Aaron Timothy Slusser
  • Publication number: 20200292305
    Abstract: A method and machine comprising at least one non-contact sensor (52) on a functional testing platform (50) for workpiece inspection and/or measurement. The inclusion of at least one non-contact sensor on the functional testing platform results in the combination of two machine platforms into a single machine and provides the user with measurement characteristics of both methods, functional and analytical, saving significant cycle time and significant space.
    Type: Application
    Filed: October 23, 2018
    Publication date: September 17, 2020
    Inventors: Parag Prakash Wagaj, Douglas Charles Beerck, Ethan James Shepherd, Michael R. Tanner, Edward J. Damron, Aaron Timothy Slusser