Abstract: A charge rebalancing integration circuit can help keep an output node of a front-end integration circuit within a specified range, e.g., without requiring resetting of the integration capacitor. The process of monitoring and rebalancing the integration circuit can operate on a much shorter time base than the integration time period, which can allow for multiple charge balancing charge transfer events during the integration time period, and sampling of the integration capacitor once per integration time period, such as at the end of that integration time period. Information about the charge rebalancing can be used to adjust subsequent discrete-time signal processing, such as digitized values of the samples. Improved dynamic range and noise performance is possible. Computed tomography (CT) imaging and other use cases are described, including those with variable integration periods.

Abstract: A charge rebalancing integration circuit can help keep an output node of a front-end integration circuit within a specified range, e.g., without requiring resetting of the integration capacitor. The process of monitoring and rebalancing the integration circuit can operate on a much shorter time base than the integration time period, which can allow for multiple charge balancing charge transfer events during the integration time period, and sampling of the integration capacitor once per integration time period, such as at the end of that integration time period. Information about the charge rebalancing can be used to adjust subsequent discrete-time signal processing, such as digitized values of the samples. Improved dynamic range and noise performance is possible. Computed tomography (CT) imaging and other use cases are described, including those with variable integration periods.

Abstract: A detector circuit can include an integrator having an amplifier, a first feedback capacitor connected between an input and output of the amplifier, one or more additional feedback capacitors connected by at least one switch between the input and output of the amplifier, and a shunt capacitor connected to the output of the amplifier. The shunt capacitor can be selected to have a capacitance value greater than that of a minimum but less than that of a maximum feedback capacitance. The detector circuit can further include a sampling circuit having a sampling capacitor connected to the output of the integrator amplifier through at least one switch, wherein the sampling capacitor is separate from the shunt capacitor. A computed tomography imaging apparatus can include the detector circuit.

Abstract: A detector circuit can include an integrator having an amplifier, a first feedback capacitor connected between an input and output of the amplifier, one or more additional feedback capacitors connected by at least one switch between the input and output of the amplifier, and a shunt capacitor connected to the output of the amplifier. The shunt capacitor can be selected to have a capacitance value greater than that of a minimum but less than that of a maximum feedback capacitance. The detector circuit can further include a sampling circuit having a sampling capacitor connected to the output of the integrator amplifier through at least one switch, wherein the sampling capacitor is separate from the shunt capacitor. A computed tomography imaging apparatus can include the detector circuit.

Abstract: The invention is a novel scheme of performing an analog to digital conversion of simultaneous sampled analog inputs using multiple sample and hold circuits and a single successive approximation analog to digital converter (“SAR ADC”). Each of the analog inputs are stored on capacitors in the sample and hold circuits, and the sample and holds are sequentially connected to the capacitor DAC. After the digital conversion of the of the input signals stored on a sample and hold, the connected sample and hold is disconnected and the charge on the DAC is reset before the next sample and hold circuit is connected. The process is repeated until all analog inputs have been converted.

Abstract: The invention is a novel scheme of performing an analog to digital conversion of simultaneous sampled analog inputs using multiple sample and hold circuits and a single successive approximation analog to digital converter (“SAR ADC”). Each of the analog inputs are stored on capacitors in the sample and hold circuits, and the sample and holds are sequentially connected to the capacitor DAC. After the digital conversion of the of the input signals stored on a sample and hold, the connected sample and hold is disconnected and the charge on the DAC is reset before the next sample and hold circuit is connected. The process is repeated until all analog inputs have been converted.

Abstract: A no-missing-code output from a SAR, pipeline, folding, flash analog to digital conversion can be obtained by providing an analog input to an analog to digital converter having a predetermined m bit resolution output and a predetermined missing code capability and generating in a digital filter from the m bit output and the dither of the random noise components of the m bit output n bit output and greater than the predetermined missing code capability of the analog to digital converter.