Patents by Inventor Paras Parkash Shah

Paras Parkash Shah has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Universal direct docking at probe test
    Patent number: 9134357
    Abstract: Techniques are described to provide a universal direct docking tester to prober interface between the test head and a prober of semiconductor wafer prober for testing die within semiconductor wafers. In an implementation, a universal direct docking tester to prober interface includes a tray assembly configured to be mounted within an opening of the prober housing and a stiffener assembly configured to be mounted to a test head to support a load board PCB that includes a probe head. The stiffener assembly includes a skirt that is received in the tray assembly when the test head is interfaced with the prober to position the load board PCB within the prober to facilitate engagement of the probe head with the wafer.
    Type: Grant
    Filed: April 4, 2011
    Date of Patent: September 15, 2015
    Assignee: Maxim Integrated, Inc.
    Inventors: Morris R. Fox, Paras Parkash Shah, Eric George Anusevicius, Richardo Chu Pakingan, Reinhardt Batino Gatchalian