Patents by Inventor Partha P. Banerjee

Partha P. Banerjee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7349078
    Abstract: In accordance with one embodiment of the present invention, a method of characterizing a lens is provided. According to the method, an optical source such as a laser is configured to generate a collimated beam that is focused along an optical axis at a distance fext. A test lens is placed along the optical axis, wherein the test lens is characterized by an effective focal length fi that is substantially independent of incident irradiance. An output beam generated from the focused optical source and the test lens defines an output intensity profile at an observation plane located a distance Z0 from the focal point of the optical source. The on-axis intensity I of the output intensity profile along the optical axis at the observation plane is monitored as the placement of the test lens along the optical axis is varied. A z-scan signature of the test lens is generated from the monitored intensity I.
    Type: Grant
    Filed: April 28, 2006
    Date of Patent: March 25, 2008
    Assignee: University of Dayton
    Inventors: Partha P. Banerjee, Yasser A. Abdelaziez