Patents by Inventor Pascal Bornat

Pascal Bornat has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7072813
    Abstract: In system design simulators, probes are software objects that collect data from simulated system components. A probe synchronization method and device are used to collect simulation data from the components during a period of interest. For example, a given event that occurs during the simulation may signal the beginning of the period, and another event may signal the end of the period. An acquisition window having a starting point and an ending point coinciding with the occurrence of the events may be used by a probe master to cause one or more probes to collect data during this period of interest. A unique Identifier or Tag of this period of interest is generated by the Probe Master and sent to all the slave probes. This Tag is dumped in the simulation database. It allows post-processing correlations between high-level simulation events and low-level model reactions.
    Type: Grant
    Filed: November 13, 2002
    Date of Patent: July 4, 2006
    Assignee: Cadence Design Systems, Inc.
    Inventors: Marc Billemaz, Pascal Bornat, Jean-Yves Brunel
  • Publication number: 20040093197
    Abstract: In system design simulators, probes are software objects that collect data from simulated system components. A probe synchronization method and device are used to collect simulation data from the components during a period of interest. For example, a given event that occurs during the simulation may signal the beginning of the period, and another event may signal the end of the period. An acquisition window having a starting point and an ending point coinciding with the occurrence of the events may be used by a probe master to cause one or more probes to collect data during this period of interest. A unique Identifier or Tag of this period of interest is generated by the Probe Master and sent to all the slave probes. This Tag is dumped in the simulation database. It allows post-processing correlations between high-level simulation events and low-level model reactions.
    Type: Application
    Filed: November 13, 2002
    Publication date: May 13, 2004
    Inventors: Marc Billemaz, Pascal Bornat, Jean-Yves Brunel