Patents by Inventor Pascal Cussonneau

Pascal Cussonneau has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing of integrated circuits using test module
    Patent number: 7941722
    Abstract: A method and apparatus for testing of integrated circuits using a Direct Memory Load Execute Dump (DMLED) test module. The method includes loading a test case into a memory using the DMLED test module, loading initialization signatures of fixed pattern into the memory using the DMLED test module, and executing the test case at an operating clock rate of a processor. The method further includes writing result signatures into the memory, and dumping the results signatures from the memory to a tester using the DMLED test module.
    Type: Grant
    Filed: June 9, 2008
    Date of Patent: May 10, 2011
    Assignee: Texas Instruments Incorporated
    Inventors: Pascal Cussonneau, Eric Bernillon
  • Security measures for preventing attacks that use test mechanisms
    Patent number: 7809934
    Abstract: A system comprising processing logic adapted to determine a type of boot performed by the system and a storage coupled to the processing logic. The processing logic is configured to erase or invalidate a predetermined portion of the storage, and to activate or deactivate an interface by which the system is accessed, if the type of boot comprises a functional boot.
    Type: Grant
    Filed: April 27, 2007
    Date of Patent: October 5, 2010
    Assignee: Texas Instruments Incorporated
    Inventors: Gregory R. Conti, Pascal Cussonneau, Benoit Drevet, Vincent Chalendard
  • Testing of Integrated Circuits Using Test Module
    Publication number: 20080320347
    Abstract: A method and apparatus for testing of integrated circuits using a Direct Memory Load Execute Dump (DMLED) test module. The method includes loading a test case into a memory using the DMLED test module, loading initialization signatures of fixed pattern into the memory using the DMLED test module, and executing the test case at an operating clock rate of a processor. The method further includes writing result signatures into the memory, and dumping the results signatures from the memory to a tester using the DMLED test module.
    Type: Application
    Filed: June 9, 2008
    Publication date: December 25, 2008
    Applicant: Texas Instruments Incorporated
    Inventors: Pascal Cussonneau, Eric Bernillon
  • SECURITY MEASURES FOR PREVENTING ATTACKS THAT USE TEST MECHANISMS
    Publication number: 20080091930
    Abstract: A system comprising processing logic adapted to determine a type of boot performed by the system and a storage coupled to the processing logic. The processing logic is configured to erase or invalidate a predetermined portion of the storage, and to activate or deactivate an interface by which the system is accessed, if the type of boot comprises a functional boot.
    Type: Application
    Filed: April 27, 2007
    Publication date: April 17, 2008
    Applicant: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Gregory R. Conti, Pascal Cussonneau, Benoit Drevet, Vincent Chalendard