Patents by Inventor Pascal Jordana

Pascal Jordana has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Capacitive measuring system
    Patent number: 7098673
    Abstract: The invention relates to a measuring device including at least one measuring probe, sequentially applying a controlled supply voltage between the measuring probe and a reference element, and integrating accumulated electric charges on the measuring probe. The device also includes at least one auxiliary measuring probe, which is also sequentially linked to a controlled electric supply and to charge integrating means. The auxiliary measuring probe has a capacity, in relation to a potential detection zone, which is different from the main measuring probe. Comparative use of signals respectively emitted by the two measuring probes enables the influence of the main measuring probe to be determined.
    Type: Grant
    Filed: June 27, 2002
    Date of Patent: August 29, 2006
    Assignee: Hitachi Computer Product (Europe) S.A.S.
    Inventors: Claude Launay, Pascal Jordana, Daniel Le Reste, William Pancirol, Joaquim Da Silva, Philippe Parbaud
  • Capacitive measuring system
    Publication number: 20050068043
    Abstract: The invention relates to a measuring device comprising at least one measuring probe (10), means for sequentially applying a controlled supply voltage between the measuring probe (10) and a reference element, and means for integrating accumulated electric charges on the measuring probe (10), characterized in that said device also comprises at least one auxiliary measuring probe (100) which is also sequentially linked to controlled electric supply means and to charge integrating means, said auxiliary measuring probe (100) having a capacity, in relation to a potential detection zone, which is different from the main measuring probe (10), whereby comparative utilization of signals respectively emitted by the two measuring probes (10,100) enables the influence of the main measuring probe to be determined.
    Type: Application
    Filed: June 27, 2002
    Publication date: March 31, 2005
    Inventors: Claude Launay, Pascal Jordana, Daniel Le Reste, William Panciroli, Joaquim Da Silva, Philippe Parbaud
  • Capacitive measurement device
    Publication number: 20040124857
    Abstract: The invention concerns a measurement device comprising at least a measuring probe (10), means (30) for sequentially applying a controlled supply voltage between the measuring probe (10) and a reference element (20) and means (50) for integrating the electric loads accumulated on the measuring probe (10). The invention is characterised in that it further comprises means (60) for correcting the integrating stage (50) input offset.
    Type: Application
    Filed: January 9, 2004
    Publication date: July 1, 2004
    Inventors: Pascal Jordana, Claude Launay, Daniel Le Reste, William Pancirolii, Joaquim Da Silva, Philippe Parbaud
  • Measuring device using an indirect measurement of permittivity
    Patent number: 6545603
    Abstract: Measuring device is presented employing indirect measurement of permittivity and including two electrically conductive bodies respectively constituting a measuring probe and a reference probe, electrical power supply means adapted to deliver a DC electrical voltage of controlled amplitude, an integrator stage including a capacitor switching system and control means adapted to define a cyclic series of two sequences at a controlled frequency.
    Type: Grant
    Filed: April 23, 2001
    Date of Patent: April 8, 2003
    Inventors: Claude Launay, Daniel Le Reste, Pascal Jordana, William Panciroli