Patents by Inventor Pascal Limbecker

Pascal Limbecker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Unified test structure for stress migration tests
    Patent number: 8174010
    Abstract: A unified test structure which is applicable for all levels of a semiconductor device including a current path chain having a first half chain and a second half chain, wherein each half chain comprises lower metallization segments, upper metallization segments, an insulating layer between the lower metallization segments and the upper metallization segments, and connection segments. Each of the connection segments is electrically connected to a contact region of one of the lower metallization segments and to a contact region of one of the upper metallization segments to thereby electrically connect the respective lower metallization segment and the respective upper metallization segment, and the first half chain and the second half chain are of different configuration.
    Type: Grant
    Filed: December 4, 2007
    Date of Patent: May 8, 2012
    Assignee: GlobalFoundries, Inc.
    Inventors: Frank Feustel, Pascal Limbecker, Oliver Aubel
  • UNIFIED TEST STRUCTURE FOR STRESS MIGRATION TESTS
    Publication number: 20080265247
    Abstract: A unified test structure which is applicable for all levels of a semiconductor device including a current path chain having a first half chain and a second half chain, wherein each half chain comprises lower metallization segments, upper metallization segments, an insulating layer between the lower metallization segments and the upper metallization segments, and connection segments. Each of the connection segments is electrically connected to a contact region of one of the lower metallization segments and to a contact region of one of the upper metallization segments to thereby electrically connect the respective lower metallization segment and the respective upper metallization segment, and the first half chain and the second half chain are of different configuration.
    Type: Application
    Filed: December 4, 2007
    Publication date: October 30, 2008
    Inventors: Frank Feustel, Pascal Limbecker, Oliver Aubel