Patents by Inventor Pascal Manigot

Pascal Manigot has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System for characterizing a beam of charged particles and machine for producing a beam of charged particles comprising such a system
    Patent number: 11333776
    Abstract: A system for characterising a beam of charged particles. The system includes a stack comprising an ultra-thin pattern formed from an electrically conductive material; a thin substrate bearing the pattern. The stack forms an emitting electrode able to emit secondary electrons in proximity to a surface of the pattern when the emitting electrode is passed through by the beam of charged particles.
    Type: Grant
    Filed: February 5, 2019
    Date of Patent: May 17, 2022
    Assignees: ECOLE POLYTECHNIQUE, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Denis Bernard, Bruno Boyer, Pascal Manigot, Christophe Thiebaux, Marc Verderi
  • SYSTEM FOR CHARACTERIZING A BEAM OF CHARGED PARTICLES AND MACHINE FOR PRODUCING A BEAM OF CHARGED PARTICLES COMPRISING SUCH A SYSTEM
    Publication number: 20200393578
    Abstract: A system for characterising a beam of charged particles. The includes a stack comprising an ultra-thin pattern formed from an electrically conductive material; a thin substrate bearing the pattern. The stack forms an emitting electrode able to emit secondary electrons in proximity to a surface of the pattern when the emitting electrode is passed through by the beam of charged particles.
    Type: Application
    Filed: February 5, 2019
    Publication date: December 17, 2020
    Applicants: ECOLE POLYTECHNIQUE, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Denis Bernard, Bruno Boyer, Pascal Manigot, Christophe Thiebaux, Marc Verderi