Patents by Inventor Pascal Miller
Pascal Miller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 9511448Abstract: A laser machining system for machining a work-piece includes a laser scanning head, external optical subsystems, and an image acquisition device. The external optical subsystems correspond to optical channels that include a first optical channel and a second optical channel. The laser scanning head controls an optical path so that a laser beam is directed and focused on the work-piece through the first optical channel and the second optical channel at different times. The first optical channel and the second optical channel correspond to respective specific portions of the work-piece to be machined by the laser beam. The image acquisition device is positioned to view the work-piece through the optical path. The image acquisition device acquires via the first optical channel one or more images of the work-piece to determine a displacement of the work-piece with reference to a best optical focus position of the second optical channel.Type: GrantFiled: August 10, 2015Date of Patent: December 6, 2016Assignee: RESONETICS, LLCInventors: Pascal Miller, Sergey V. Broude, David L. Wall, Kenneth Todd McDaniel, David S. Holbrook
-
Publication number: 20150343561Abstract: A laser machining system for machining a work-piece includes a laser scanning head, external optical subsystems, and an image acquisition device. The external optical subsystems correspond to optical channels that include a first optical channel and a second optical channel. The laser scanning head controls an optical path so that a laser beam is directed and focused on the work-piece through the first optical channel and the second optical channel at different times. The first optical channel and the second optical channel correspond to respective specific portions of the work-piece to be machined by the laser beam. The image acquisition device is positioned to view the work-piece through the optical path. The image acquisition device acquires via the first optical channel one or more images of the work-piece to determine a displacement of the work-piece with reference to a best optical focus position of the second optical channel.Type: ApplicationFiled: August 10, 2015Publication date: December 3, 2015Inventors: Pascal Miller, Sergey V. Broude, David L. Wall, Kenneth Todd McDaniel
-
Patent number: 9132585Abstract: Embodiments of the present disclosure are directed to systems (300), devices and methods for machining a work-piece from a plurality of directions using a single laser beam and galvanometer scan head (302). In some embodiments, such a system includes, for example, a scanning galvanometer head (“scan-head”) (302), having one or more mirrors (323) for directing a laser beam in at least one plane. Preferably, in some embodiments, the scan-head includes two mirrors for deflecting the laser beam in the at least one plane (e.g., an X-Y plane). A plurality of second mirrors (312A, 312B, 312C) is arranged after the scan-head (302) to direct the laser onto a predetermined portion of the exterior of the object to be machined. In some preferred embodiments, there are three such second mirrors (312A, 312B, 312C) each to direct the laser over a 120 degree area of the object.Type: GrantFiled: December 30, 2010Date of Patent: September 15, 2015Assignee: RESONETICS, LLCInventors: Pascal Miller, Sergey Broude, David L. Wall, Kenneth Todd McDaniel
-
Patent number: 8772671Abstract: Methods and systems for precisely removing selected layers of materials from a multi-layer work piece using laser ablation are disclosed. Precise removal of one or more selected layers of materials of a work piece may be performed by irradiating at least one location on a multi-layer work piece with a laser beam, ablating material at the at least one location, detecting one or more characteristics of the material ablated at the at least one location and analyzing the one or more characteristics to identify a change in at least one of the one or more characteristics that indicates a change in the type of material being ablated. Related systems are also described.Type: GrantFiled: May 20, 2011Date of Patent: July 8, 2014Assignee: Resonetics, LLCInventors: Sergey V. Broude, Chen-Hsiung Cheng, Pascal Miller, Glenn Ogura, David L. Wall
-
Publication number: 20130193618Abstract: Embodiments of the present disclosure are directed to systems (300), devices and methods for machining a work-piece from a plurality of directions using a single laser beam and galvanometer scan head (302). In some embodiments, such a system includes, for example, a scanning galvanometer head (“scan-head”) (302), having one or more mirrors (323) for directing a laser beam in at least one plane. Preferably, in some embodiments, the scan-head includes two mirrors for deflecting the laser beam in the at least one plane (e.g., an X-Y plane). A plurality of second mirrors (312A, 312B, 312C) is arranged after the scan-head (302) to direct the laser onto a predetermined portion of the exterior of the object to be machined. In some preferred embodiments, there are three such second mirrors (312A, 312B, 312C) each to direct the laser over a 120 degree area of the object.Type: ApplicationFiled: December 30, 2010Publication date: August 1, 2013Applicant: RESONETICS LLCInventors: Pascal Miller, Sergey Broude, David L. Wall, Kenneth Todd McDaniel
-
Publication number: 20120000893Abstract: Methods and systems for precisely removing selected layers of materials from a multi-layer work piece using laser ablation are disclosed. Precise removal of one or more selected layers of materials of a work piece may be performed by irradiating at least one location on a multi-layer work piece with a laser beam, ablating material at the at least one location, detecting one or more characteristics of the material ablated at the at least one location and analyzing the one or more characteristics to identify a change in at least one of the one or more characteristics that indicates a change in the type of material being ablated. Related systems are also described.Type: ApplicationFiled: May 20, 2011Publication date: January 5, 2012Applicant: Resonetics, LLCInventors: Sergey V. Broude, Chen-Hsiung Cheng, Pascal Miller, Glenn Ogura, David L. Wall
-
Publication number: 20110011839Abstract: Embodiments of the present invention are directed to methods and systems for micromachining a conical surface. In one embodiment, such a system may include a rotating platform for receiving a long line of laser illumination, a mask having a predetermined pattern comprising a sector of a planar ring, the mask being positioned on the rotating platform, a workpiece stage having a rotational axis for rotating a removably-affixed workpiece comprising a conical surface, wherein the sector comprises the planar image of the conical surface, an excimer laser for producing a laser beam, a homogenizer for homogenizing the laser beam in at least a single direction, at least one condenser lens, a turning mirror and at least one projection lens.Type: ApplicationFiled: September 21, 2010Publication date: January 20, 2011Applicant: Resonetics, Inc.Inventors: Sergey V. Broude, Rong Gu, David S. Holbrook, Kenneth T. McDaniel, Pascal Miller, David L. Wall
-
Patent number: 7812280Abstract: Embodiments of the present invention are directed to methods and systems for micromachining a conical surface. In one embodiment, such a system may include a rotating platform for receiving a long line of laser illumination, a mask having a predetermined pattern comprising a sector of a planar ring, the mask being positioned on the rotating platform, a workpiece stage having a rotational axis for rotating a removably-affixed workpiece comprising a conical surface, wherein the sector comprises the planar image of the conical surface, an excimer laser for producing a laser beam, a homogenizer for homogenizing the laser beam in at least a single direction, at least one condenser lens, a turning mirror and at least one projection lens.Type: GrantFiled: December 2, 2005Date of Patent: October 12, 2010Assignee: Resonetics, Inc.Inventors: Sergey V. Broude, Rong Gu, David S. Holbrook, Kenneth T. McDaniel, Pascal Miller, David L. Wall
-
SYSTEM AND METHOD FOR MAKING SEAMLESS HOLOGRAMS, OPTICALLY VARIABLE DEVICES AND EMBOSSING SUBSTRATES
Publication number: 20080218817Abstract: Apparatus and method for producing optically variable devices, optically variable media, dot matrix holograms or embossing substrates. The system includes: a laser beam generator, a laser beam shaper, a spatial light modulator, imaging optics and an image positioner. The laser beam generator generates a laser beam, which is shaped by the laser beam shaper to modify the laser beam to an optimized beam profile. The shaped laser beam is modulated by the spatial light modulator, which generates, at a place removed from the substrate surface, an optical pattern. The imaging optics causes the optical pattern to be imaged on the substrate surface. An image positioner allows for the optical pattern to be positioned to different areas of the substrate surface.Type: ApplicationFiled: March 7, 2007Publication date: September 11, 2008Inventors: Robert K. Grygier, Sergey Broude, Pascal Miller, Andrew Wilkie, David Holbrook -
Publication number: 20070206383Abstract: Embodiments of the present invention are directed to an illuminating optical device for forming a field of illumination. The optical device includes a first one-dimensional homogenizer positioned to homogenize a first dimension/axis of the field of illumination and a second one-dimensional homogenizer positioned to homogenize a second dimension/axis of the field of illumination.Type: ApplicationFiled: May 1, 2007Publication date: September 6, 2007Applicant: Resonetics, Inc.Inventors: Sergey Broude, David Holbrook, Pascal Miller
-
Patent number: 7210820Abstract: Embodiments of the present invention are directed to an illuminating optical device for forming a field of illumination. The optical device includes a first one-dimensional homogenizer positioned to homogenize a first dimension/axis of the field of illumination and a second one-dimensional homogenizer positioned to homogenize a second dimension/axis of the field of illumination.Type: GrantFiled: May 4, 2004Date of Patent: May 1, 2007Assignee: Resonetics, Inc.Inventors: Sergey V. Broude, David S. Holbrook, Pascal Miller
-
Publication number: 20060144829Abstract: Embodiments of the present invention are directed to methods and systems for micromachining a conical surface. In one embodiment, such a system may include a rotating platform for receiving a long line of laser illumination, a mask having a predetermined pattern comprising a sector of a planar ring, the mask being positioned on the rotating platform, a workpiece stage having a rotational axis for rotating a removably-affixed workpiece comprising a conical surface, wherein the sector comprises the planar image of the conical surface, an excimer laser for producing a laser beam, a homogenizer for homogenizing the laser beam in at least a single direction, at least one condenser lens, a turning mirror and at least one projection lens.Type: ApplicationFiled: December 2, 2005Publication date: July 6, 2006Inventors: Sergey Broude, Rong Gu, David Holbrook, Kenneth McDaniel, Pascal Miller, David Wall
-
Publication number: 20040223330Abstract: Embodiments of the present invention are directed to an illuminating optical device for forming a field of illumination. The optical device includes a first one-dimensional homogenizer positioned to homogenize a first dimension/axis of the field of illumination and a second one-dimensional homogenizer positioned to homogenize a second dimension/axis of the field of illumination.Type: ApplicationFiled: May 4, 2004Publication date: November 11, 2004Inventors: Sergey V. Broude, David S. Holbrook, Pascal Miller
-
Patent number: 6509547Abstract: This invention results from the realization that a laser can remove the protective layer(s) from the glass or fused silica optical fiber core and cladding more effectively and more reliably than chemical or mechanical means. This invention teaches methods of using laser beams to remove the protective layers of fibers without significantly damaging the optical and mechanical properties of the fiber and without leaving an excessive amount of residual ablation debris on the fiber while providing careful control of the laser energy. This method thereby allows users to safely strip protective layers off sensitive fibers, such as fibers used for fiber Bragg gratings (FBG). This method allows stripping of the protective layers from single fibers and from multi-fiber ribbon cables. It also allows stripping of the protective layers at an end section of the cable or in a middle section (mid-span).Type: GrantFiled: November 28, 2000Date of Patent: January 21, 2003Assignee: Resonetics, Inc.Inventors: Jeffrey Bernstein, James Angell, Pascal Miller
-
Patent number: 6501045Abstract: A new method and apparatus for moving an excimer laser beam relative to a workpiece to control the wall profile of laser machined features, such as holes and grooves. An excimer laser beam is displaced relative to a workpiece in a substantially circular motion and the substantially circular motion is further displaced relative to the workpiece to correspond to a desired shape.Type: GrantFiled: April 6, 2000Date of Patent: December 31, 2002Assignees: Resonetics, Inc., Kawamura Sangyo Co., Ltd.Inventors: Jeffrey Bernstein, Pascal Miller, Hideyuki Morishita
-
Patent number: 5814829Abstract: An inspection system and an inspection method, the method including detecting flaws on a surface, determining the size, count, and position of flaws on the surface, providing a representation of the detected flaws by size, count, and position on a display, setting a display threshold value which is a function of a number of particles of a particular size to be displayed on the display, determining when the display threshold is breached and in response adjusting the display to cease displaying those flaws, storing at least one inspection threshold value, and determining when the inspection threshold value is breached and in response outputting an inspection interrupt signal to stop the inspection after the inspection threshold value is breached.Type: GrantFiled: July 11, 1995Date of Patent: September 29, 1998Assignee: QC Optics, Inc.Inventors: Sergey V. Broude, Nicholas Allen, Abdu Boudour, Eric Chase, Carl Johnson, Pascal Miller, Jay Ormsby
-
Patent number: 5717198Abstract: A pellicle reflectivity monitoring system comprising a radiation source for directing radiation through a pellicle to an object to be inspected, a sensor device positioned to receive the portion of the radiation reflected by the pellicle, a processor, responsive to the sensor device, for determining the intensity of the portion of the radiation reflected by the pellicle, and a lens assembly, positioned in an optical path between the pellicle and the sensor device, for directing the portion of the radiation reflected by pellicles of different heights onto the sensor device. A comparator device compares the intensity of the radiation directed at the object to be inspected with the intensity of the portion of the radiation reflected by the pellicle and outputs a correction factor based on the comparison in order to compensate for the portion of the radiation reflected by the pellicle.Type: GrantFiled: July 10, 1995Date of Patent: February 10, 1998Assignee: QC Optics, Inc.Inventors: Sergey V. Broude, Nicholas Allen, Abdu Boudour, Eric Chase, Carl Johnson, Pascal Miller, Jay Ormsby
-
Patent number: 5675409Abstract: A plate holder for a plate surface inspection system, the plate holder including a plate holder body and a calibration plate integral with the plate holder body thereby eliminating the need to load a separate special calibration plate in the plate holder each time the surface inspection system needs to be calibrated.Type: GrantFiled: July 10, 1995Date of Patent: October 7, 1997Assignee: QC Optics, Inc.Inventors: Sergey V. Broude, David Giroux, Abdu Boudour, Eric Chase, Carl Johnson, Pascal Miller, Nicholas Allen, Jay Ormsby
-
Patent number: 5672885Abstract: A surface displacement detection system including a detector for detecting displacement of a surface in a direction normal to the surface as the surface revolves; an encoder which divides the surface into N sectors; a signal processor responsive to the detector for calculating the amount of displacement of the surface in each sector of the surface as it revolves; a displacement value look-up table; and a routine for writing to the table a displacement value for each sector once per M revolutions, and an adjustment system including a focussing actuating element, a routine to read displacement value look-up table, a routine to for updating the position of the focussing actuating element for every sector, according to the displacement values stored in the look-up table.Type: GrantFiled: July 10, 1995Date of Patent: September 30, 1997Assignee: QC Optics, Inc.Inventors: Nicholas Allen, Abdu Broudour, Sergey Broude, Eric Chase, Carl Johnson, Pascal Miller, Jay Ormsby, Arkady Savikovsky
-
Patent number: 5625193Abstract: An improved optical inspection system for detecting flaws on a diffractive surface containing surface patterns includes: an ultraviolet illumination means for illuminating a region on the diffractive surface to generate a scattered intensity distribution in response to either a flaw or a surface pattern; means for detecting the intensity level of the scattered intensity distribution at a plurality of locations about the diffractive surface; means for establishing a minimum detected intensity level; means, responsive to the minimum detected intensity level, for indicating the absence of a flaw on the illuminated region of the diffractive surface when the minimum detected intensity level is below a threshold intensity level and for indicating the presence of a flaw on the illuminated region of the diffractive surface when the minimum detected intensity level exceeds the threshold intensity level; and means for moving the diffractive surface to generate a scan pattern on the diffractive surface to inspect the enType: GrantFiled: July 10, 1995Date of Patent: April 29, 1997Assignee: QC Optics, Inc.Inventors: Sergey V. Broude, Nicholas Allen, Abdu Boudour, Eric Chase, Carl Johnson, Pascal Miller, Jay Ormsby