Patents by Inventor Pascal Waroux

Pascal Waroux has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Low coherence interferometric system for phase stepping shearography combined with 3D profilometry
    Patent number: 8873068
    Abstract: The present invention relates to a portable industrial instrument for performing, in an integrated and two-way manner, an interferometric fringe projection and shearography, on a object to be tested, so that, when the two-way interferometer (1) is associated with the coherent or quasi-coherent projection device (2), the instrument is able to measure the 3D shape of the object by interferometric fringe projection, also known as moiré method, and, when the two-way interferometer (1) is associated with the recording or imaging device (4), the instrument is able to perform shearographic measurements on the object, the direction of the traversing light beam in the interferometer (1) being reversed when shifting from one measurement configuration to the other one.
    Type: Grant
    Filed: December 4, 2012
    Date of Patent: October 28, 2014
    Assignees: Cockerill Maintenance & Ingenierie S.A., Universite de Liege
    Inventors: Pascal Blain, Yvon Renotte, Serge Habraken, Pascal Waroux
  • LOW COHERENCE INTERFEROMETRIC SYSTEM FOR PHASE STEPPING SHEAROGRAPHY COMBINED WITH 3D PROFILOMETRY
    Publication number: 20130141712
    Abstract: The present invention relates to a portable industrial instrument for performing, in an integrated and two-way manner, an interferometric fringe projection and shearography, on a object to be tested, so that, when the two-way interferometer (1) is associated with the coherent or quasi-coherent projection device (2), the instrument is able to measure the 3D shape of the object by interferometric fringe projection, also known as moiré method, and, when the two-way interferometer (1) is associated with the recording or imaging device (4), the instrument is able to perform shearographic measurements on the object, the direction of the traversing light beam in the interferometer (1) being reversed when shifting from one measurement configuration to the other one.
    Type: Application
    Filed: December 4, 2012
    Publication date: June 6, 2013
    Inventors: Pascal Blain, Yvon Renotte, Serge Habraken, Pascal Waroux