Patents by Inventor Patricia Karen Konopka

Patricia Karen Konopka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHODS TO CONTROL ADHESIVENESS USING TOPOGRAPHY
    Publication number: 20180299265
    Abstract: Methods and systems are disclosed for analyzing the adhesiveness of enamel frits using topography. One method includes analyzing a topography of a defined area of an enamel frit surface having a plurality of peaks and determining a topographical parameter of the defined area based on peak shape and/or density. The determined topographical parameter may be compared to a threshold value. The method may then include applying an adhesive to the enamel frit and bonding the enamel frit to a substrate if the determined topographical parameter is below the threshold value. The analysis of the topography may be performed using a non-contact profilometer, such as an optical profilometer. In one embodiment, the topographical parameter may be developed interfacial roughness (Sdr). The method may be integrated into a manufacturing/assembly line for vehicle glass components, such as windshields or side windows.
    Type: Application
    Filed: April 12, 2017
    Publication date: October 18, 2018
    Inventors: Larry Paul Haack, Shannon Christine Bollin, Ann Marie Straccia, Sabrina Louise Peczonczyk, Steven J. Simko, Patricia Karen Konopka
  • Methods to control adhesiveness using topography
    Patent number: 10101149
    Abstract: Methods and systems are disclosed for analyzing the adhesiveness of enamel frits using topography. One method includes analyzing a topography of a defined area of an enamel frit surface having a plurality of peaks and determining a topographical parameter of the defined area based on peak shape and/or density. The determined topographical parameter may be compared to a threshold value. The method may then include applying an adhesive to the enamel frit and bonding the enamel frit to a substrate if the determined topographical parameter is below the threshold value. The analysis of the topography may be performed using a non-contact profilometer, such as an optical profilometer. In one embodiment, the topographical parameter may be developed interfacial roughness (Sdr). The method may be integrated into a manufacturing/assembly line for vehicle glass components, such as windshields or side windows.
    Type: Grant
    Filed: April 12, 2017
    Date of Patent: October 16, 2018
    Assignee: Ford Global Technologies, LLC
    Inventors: Larry Paul Haack, Shannon Christine Bollin, Ann Marie Straccia, Sabrina Louise Peczonczyk, Steven J. Simko, Patricia Karen Konopka