Patents by Inventor Patrick A. Renalds

Patrick A. Renalds has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6781694
    Abstract: An absolute 2D position-sensing device is usable to measure the relative position of two elements. A 2D absolute scale includes an integrated 2D absolute scale pattern extending over the 2D scale area along each measuring axis of the scale. The integrated 2D absolute scale pattern includes a plurality of periodic portions interleaved with a plurality of non-periodic portions along each axis. Each periodic portion includes a plurality of periodically-placed scale elements. Each non-periodic portion includes a plurality of code elements indicative of an absolute measurement value. The code elements may have a length that is narrower along each measuring axis is than the length of the periodic scale elements along each measuring axis. The offset of the periodically-placed elements relative to a readhead of the device is combined with the absolute measurement value to determine an absolute position.
    Type: Grant
    Filed: September 13, 2002
    Date of Patent: August 24, 2004
    Assignee: Mitutoyo Corporation
    Inventors: Michael Nahum, Benjamin K. Jones, Patrick A. Renalds, Avron M. Zwilling, Kim W. Atherton
  • Publication number: 20040012794
    Abstract: An absolute 2D position-sensing device is usable to measure the relative position of two elements. A 2D absolute scale includes an integrated 2D absolute scale pattern extending over the 2D scale area along each measuring axis of the scale. The integrated 2D absolute scale pattern includes a plurality of periodic portions interleaved with a plurality of non-periodic portions along each axis. Each periodic portion includes a plurality of periodically-placed scale elements. Each non-periodic portion includes a plurality of code elements indicative of an absolute measurement value. The code elements may have a length that is narrower along each measuring axis is than the length of the periodic scale elements along each measuring axis. The offset of the periodically-placed elements relative to a readhead of the device is combined with the absolute measurement value to determine an absolute position.
    Type: Application
    Filed: September 13, 2002
    Publication date: January 22, 2004
    Applicant: MITUTOYO CORPORATION
    Inventors: Michael Nahum, Benjamin K. Jones, Patrick A. Renalds, Avron M. Zwilling, Kim W. Atherton