Patents by Inventor Patrick A. Themins

Patrick A. Themins has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test access architecture for testing of circuits modules at an intermediate node within an integrated circuit chip
    Patent number: 5604432
    Abstract: A test access architecture is implemented which allows embedded testing of reusable modules and their interconnections with each other and with primary system inputs and outputs, utilizing reusable test vectors regardless of the configuration of the integrated circuit. Also provided is a method and apparatus for controlling and observing signals within the logic of a module, using the same test access architecture.
    Type: Grant
    Filed: November 5, 1993
    Date of Patent: February 18, 1997
    Assignee: Intel Corporation
    Inventors: Alan Moore, Patrick A. Themins
  • Apparatus for a test access architecture for testing of modules within integrated circuits
    Patent number: 5534774
    Abstract: A test access architecture is implemented which allows embedded testing of reusable modules and their interconnections with each other and with primary system inputs and outputs, utilizing reusable test vectors regardless of the configuration of the integrated circuit. Also provided is a method and apparatus for controlling and observing signals within the logic of a module, using the same test access architecture.
    Type: Grant
    Filed: April 23, 1992
    Date of Patent: July 9, 1996
    Assignee: Intel Corporation
    Inventors: Alan Moore, Patrick A. Themins