Patents by Inventor Patrick Blanckaert

Patrick Blanckaert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180135969
    Abstract: The disclosure relates to a system for measuring the position of an object in a measurement volume, including: an optical angular measurement device, disposed with static optics, configured for measurement of the an azimuth and elevation angle of the object in the measurement volume with respect to the optical angular measurement device, a range measurement device, disposed with static component, configured for measurement of the range of the object in the measurement volume. It further relates to a use of the system and a measurement method.
    Type: Application
    Filed: November 1, 2017
    Publication date: May 17, 2018
    Applicant: NIKON METROLOGY N.V.
    Inventors: Geert VANDENHOUDT, Patrick BLANCKAERT, Hans THIELEMANS
  • Patent number: 9696146
    Abstract: The present invention relates to a scanning probe (100) for the dimensional acquisition of an object (400) by irradiating the object (400) with light and detecting reflected light comprising: a detection unit (120) comprising an imaging sensor (122) and a sensor lens assembly (124) for detecting the reflected light, a light projecting unit (141) comprising a light source (142) for generating light, and source optics (145) for focusing the light, and light plane generating optics (143) for generating a light plane (149) for irradiating the object, and an adjustment mechanism (155) comprised in the light projecting unit (141), for adjusting the position or orientation of the light plane relative to the detection unit. It further relates to a method for assembly of a scanning probe (100).
    Type: Grant
    Filed: March 28, 2013
    Date of Patent: July 4, 2017
    Assignee: NIKON METROLOGY NV
    Inventors: Patrick Blanckaert, Frank Thys, Raf Nysen, Geert Vandenhoudt
  • Patent number: 9205576
    Abstract: There is provided a measuring apparatus including: an imaging optical system configured to form an image of an object to be measured; and an imaging section including a transmissive member which is arranged in the vicinity of an image plane of the imaging optical system to be inclined with respect an optical axis of the imaging optical system. The imaging optical system includes a first optical member which is non-coaxial with respect to the optical axis.
    Type: Grant
    Filed: February 6, 2013
    Date of Patent: December 8, 2015
    Assignee: NIKON CORPORATION
    Inventors: Daisuke Kitazawa, Patrick Blanckaert
  • Publication number: 20150043008
    Abstract: The present invention relates to a scanning probe (100) for the dimensional acquisition of an object (400) by irradiating the object (400) with light and detecting reflected light comprising: a detection unit (120) comprising an imaging sensor (122) and a sensor lens assembly (124) for detecting the reflected light, a light projecting unit (141) comprising a light source (142) for generating light, and source optics (145) for focusing the light, and light plane generating optics (143) for generating a light plane (149) for irradiating the object, and an adjustment mechanism (155) comprised in the light projecting unit (141), for adjusting the position or orientation of the light plane relative to the detection unit. It further relates to a method for assembly of a scanning probe (100).
    Type: Application
    Filed: March 28, 2013
    Publication date: February 12, 2015
    Inventors: Patrick Blanckaert, Frank Thys, Raf Nysen, Geert Vandenhoudt
  • Publication number: 20140043622
    Abstract: The disclosure relates to a system for measuring the position of an object in a measurement volume, including: an optical angular measurement device, disposed with static optics, configured for measurement of the an azimuth and elevation angle of the object in the measurement volume with respect to the optical angular measurement device, a range measurement device, disposed with static component, configured for measurement of the range of the object in the measurement volume. It further relates to a use of the system and a measurement method.
    Type: Application
    Filed: February 17, 2012
    Publication date: February 13, 2014
    Applicant: NIKON METROLOGY N.V.
    Inventors: Geert Vandenhoudt, Patrick Blanckaert, Hans Thielemans