Patents by Inventor Patrick D. Pannese

Patrick D. Pannese has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080155448
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155449
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155443
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155445
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155447
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155450
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155444
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155442
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080145192
    Abstract: A variety of process modules are described for use in semiconductor manufacturing processes.
    Type: Application
    Filed: February 14, 2008
    Publication date: June 19, 2008
    Inventors: Peter van der Meulen, Christopher C. Kiley, Patrick D. Pannese
  • Publication number: 20080147580
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: February 18, 2008
    Publication date: June 19, 2008
    Inventor: Patrick D. Pannese
  • Publication number: 20080134075
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 5, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080134076
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 5, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080124195
    Abstract: A variety of process modules are described for use in semiconductor manufacturing processes.
    Type: Application
    Filed: October 23, 2007
    Publication date: May 29, 2008
    Inventors: Peter van der Meulen, Christopher C. Kiley, Patrick D. Pannese
  • Publication number: 20080124194
    Abstract: A variety of process modules are described for use in semiconductor manufacturing processes.
    Type: Application
    Filed: October 23, 2007
    Publication date: May 29, 2008
    Inventors: Peter van der Meulen, Christopher C. Kiley, Patrick D. Pannese
  • Publication number: 20080124193
    Abstract: A variety of process modules are described for use in semiconductor manufacturing processes.
    Type: Application
    Filed: October 23, 2007
    Publication date: May 29, 2008
    Inventors: Peter van der Meulen, Christopher C. Kiley, Patrick D. Pannese
  • Publication number: 20080124196
    Abstract: A variety of process modules are described for use in semiconductor manufacturing processes.
    Type: Application
    Filed: October 23, 2007
    Publication date: May 29, 2008
    Inventors: Peter van der Meulen, Christopher C. Kiley, Patrick D. Pannese
  • Publication number: 20080124197
    Abstract: A variety of process modules are described for use in semiconductor manufacturing processes.
    Type: Application
    Filed: October 23, 2007
    Publication date: May 29, 2008
    Inventors: Peter van der Meulen, Christopher C. Kiley, Patrick D. Pannese