Patents by Inventor Patrick Daniel White

Patrick Daniel White has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Leakage source detection for memory with varying conductive path lengths
    Patent number: 11636911
    Abstract: Methods, systems, and devices for leakage source detection are described. In some cases, a testing device may scan a first set of access lines of a memory die that have a first length and a second set of access lines of the memory die that have a second length different than the first length. The testing device may determine a first error rate associated with the first set of access lines and a second error rate associated with the second set of access lines. The testing device may categorize a performance of the memory die based on the first and second error rates. In some cases, the testing device may determine a third error rate associated with a type of error based on the first and second error rates and may categorize the performance of the memory die based on the third error rate.
    Type: Grant
    Filed: July 28, 2021
    Date of Patent: April 25, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Amitava Majumdar, Radhakrishna Kotti, Patrick Daniel White, Pavan Reddy K Aella, Rajesh Kamana
  • LEAKAGE SOURCE DETECTION
    Publication number: 20220020446
    Abstract: Methods, systems, and devices for leakage source detection are described. In some cases, a testing device may scan a first set of access lines of a memory die that have a first length and a second set of access lines of the memory die that have a second length different than the first length. The testing device may determine a first error rate associated with the first set of access lines and a second error rate associated with the second set of access lines. The testing device may categorize a performance of the memory die based on the first and second error rates. In some cases, the testing device may determine a third error rate associated with a type of error based on the first and second error rates and may categorize the performance of the memory die based on the third error rate.
    Type: Application
    Filed: July 28, 2021
    Publication date: January 20, 2022
    Inventors: Amitava Majumdar, Radhakrishna Kotti, Patrick Daniel White, Pavan Reddy K. Aella, Rajesh Kamana
  • Leakage source detection by scanning access lines
    Patent number: 11081203
    Abstract: Methods, systems, and devices for leakage source detection are described. In some cases, a testing device may scan a first set of access lines of a memory die that have a first length and a second set of access lines of the memory die that have a second length different than the first length. The testing device may determine a first error rate associated with the first set of access lines and a second error rate associated with the second set of access lines. The testing device may categorize a performance of the memory die based on the first and second error rates. In some cases, the testing device may determine a third error rate associated with a type of error based on the first and second error rates and may categorize the performance of the memory die based on the third error rate.
    Type: Grant
    Filed: November 14, 2019
    Date of Patent: August 3, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Amitava Majumdar, Radhakrishna Kotti, Patrick Daniel White, Pavan Reddy K Aella, Rajesh Kamana
  • LEAKAGE SOURCE DETECTION BY SCANNING ACCESS LINES
    Publication number: 20210151119
    Abstract: Methods, systems, and devices for leakage source detection are described. In some cases, a testing device may scan a first set of access lines of a memory die that have a first length and a second set of access lines of the memory die that have a second length different than the first length. The testing device may determine a first error rate associated with the first set of access lines and a second error rate associated with the second set of access lines. The testing device may categorize a performance of the memory die based on the first and second error rates. In some cases, the testing device may determine a third error rate associated with a type of error based on the first and second error rates and may categorize the performance of the memory die based on the third error rate.
    Type: Application
    Filed: November 14, 2019
    Publication date: May 20, 2021
    Inventors: Amitava Majumdar, Radhakrishna Kotti, Patrick Daniel White, Pavan Reddy K. Aella, Rajesh Kamana
  • Novelty waterfowl call
    Patent number: D943445
    Type: Grant
    Filed: December 18, 2019
    Date of Patent: February 15, 2022
    Inventors: Patrick Daniel White, Lisa Diane Goslin
  • Novelty waterfowl call
    Patent number: D944107
    Type: Grant
    Filed: December 18, 2019
    Date of Patent: February 22, 2022
    Inventors: Patrick Daniel White, Lisa Diane Goslin