Abstract: A non-contact testing of electrical characteristics of substrates carrying dense electrical connections is non-contact in that an injection or an extraction of electrons in the conductors to be tested, is obtained by an electron tearing effect under the effect of an electromagnetic beam of ultraviolet rays. The test device has an electron collector plate conformed as an array of individually addressable electrodes, able to be taken to a positive or negative potential in order to carry out an injection or an extraction of electrons. A capacitor is associated with each electrode. The individual electrode is produced in the form of an open-work conductive grid constituting a first plate of the capacitor. The other plate is constituted by an open-work grid situated plumb with the first one.

Abstract: The invention relates to the non-contact testing of electrical characteristics of substrates carrying dense electrical connections (“chip-carriers” and others). The testing is non-contact in the sense that an injection or an extraction of electrons in the conductors to be tested is obtained by an electron tearing effect under the effect of an electromagnetic beam of ultraviolet rays. The test device comprises an electron collector plate conformed as an array of individually addressable electrodes, able to be taken to a positive or negative potential in order to carry out an injection or an extraction of electrons. A capacitor is associated with each electrode. The individual electrode is produced in the form of an open-work conductive grid constituting a first plate of the capacitor. The other plate is constituted by an open-work grid situated plumb with the first one.