Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.

Abstract: A method of measuring thermal conductivity of a material includes aiming a modulated pump laser beam having a modulation frequency low enough to induce a cyclical steady-state temperature rise having “on” and “off” state at a spot of a material, aiming a CW probe laser beam at the spot and generating a reflected probe beam reflected from the spot on the material, the reflected probe beam having a magnitude of a reflectance signal as a function of the temperature of the material and being periodic corresponding to the cyclical temperature rise, measuring the pump power difference and the reflectance signal magnitude difference between the “on” and “off” states, and calculating the thermal conductivity by fitting the measured power difference and the measured reflectance signal magnitude difference to a thermal model which is a function of a thermal conductivity of the material relating the heat flux to the temperature rise.

Abstract: A method of measuring thermal conductivity of a material includes focusing a modulated pump laser beam having a modulation frequency that induces a cyclical steady-state temperature rise at a spot of a material, focusing a CW probe laser beam at the spot and generating a reflected probe beam reflected from the spot on the material, the reflected probe beam having a magnitude of a reflectance signal as a function of the temperature of the material and being periodic corresponding to the cyclical temperature rise, measuring the magnitude of the reflectance signals of the reflected probe beam, and determining the thermal conductivity by fitting the power of the pump beam and the measured magnitude of the reflectance signal to a thermal model which is a function of a thermal conductivity of the material relating the radial heat flux to the temperature rise.

Abstract: Disclosed herein are low dielectric constant (low-k) two-dimensional covalent organic framework materials that have a dielectric constant k less than 2.4, optionally less than 1.9, and are comprised of regularly porous, covalently linked, layer structures.

Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.

Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.

Abstract: A method of measuring thermal conductivity of a material includes focusing a modulated pump laser beam having a modulation frequency that induces a cyclical steady-state temperature rise at a spot of a material, focusing a CW probe laser beam at the spot and generating a reflected probe beam reflected from the spot on the material, the reflected probe beam having a magnitude of a reflectance signal as a function of the temperature of the material and being periodic corresponding to the cyclical temperature rise, measuring the magnitude of the reflectance signals of the reflected probe beam, and determining the thermal conductivity by fitting the power of the pump beam and the measured magnitude of the reflectance signal to a thermal model which is a function of a thermal conductivity of the material relating the radial heat flux to the temperature rise.

Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.

Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.

Abstract: The present disclosure relates to flexible thermoelectric devices. In some embodiments, such devices can comprise a flexible substrate with a first conductive component and a second, different conductive component deposited thereon so as to form a plurality of electrical junctions. The flexible substrate can be a fabric, and the conductive component can be deposited by methods such as stitching of conductive yarns or deposition of conductive inks. The present disclosure further relates to methods of preparing flexible thermoelectric devices and methods of utilizing flexible thermoelectric devices for producing electrical current from waste heat.

Abstract: Ion implantation can be used to define a thermal dissipation path that allows for better thermal isolation between devices in close proximity on a microelectronics chip, thus providing a means for higher device density combined with better performance.

Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.

Abstract: Ion implantation can be used to define a thermal dissipation path that allows for better thermal isolation between devices in close proximity on a microelectronics chip, thus providing a means for higher device density combined with better performance.

Abstract: The present disclosure relates to flexible thermoelectric devices. In some embodiments, such devices can comprise a flexible substrate with a first conductive component and a second, different conductive component deposited thereon so as to form a plurality of electrical junctions. The flexible substrate can be a fabric, and the conductive component can be deposited by methods such as stitching of conductive yarns or deposition of conductive inks. The present disclosure further relates to methods of preparing flexible thermoelectric devices and methods of utilizing flexible thermoelectric devices for producing electrical current from waste heat.

Abstract: The present disclosure relates to flexible thermoelectric devices. In some embodiments, such devices can comprise a flexible substrate with a first conductive component and a second, different conductive component deposited thereon so as to form a plurality of electrical junctions. The flexible substrate can be a fabric, and the conductive component can be deposited by methods such as stitching of conductive yarns or deposition of conductive inks. The present disclosure further relates to methods of preparing flexible thermoelectric devices and methods of utilizing flexible thermoelectric devices for producing electrical current from waste heat.

Abstract: A method of forming a thermal barrier coating is disclosed. The method may include providing a solution containing strontium and niobium and applying the solution to a substrate via a chemical solution deposition process to form a first film layer on the substrate. The method may further include pyrolyzing the first film layer and annealing the first film in an air atmosphere to form a strontium niobate coating.

Abstract: The present disclosure relates to flexible thermoelectric devices. In some embodiments, such devices can comprise a flexible substrate with a first conductive component and a second, different conductive component deposited thereon so as to form a plurality of electrical junctions. The flexible substrate can be a fabric, and the conductive component can be deposited by methods such as stitching of conductive yarns or deposition of conductive inks. The present disclosure further relates to methods of preparing flexible thermoelectric devices and methods of utilizing flexible thermoelectric devices for producing electrical current from waste heat.