Patents by Inventor Patrick Elwer

Patrick Elwer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • AC testing of leakage current in integrated circuits using RC time constant
    Patent number: 7348790
    Abstract: Some embodiments of the invention include apparatus and systems having integrated circuits. Terminals or pins of the integrated circuits are configured to be driven to a state, to be floated for a time interval, and to be measured to determine the state of the terminals after the time interval. The measurement involves sampling the RC time constant of leakage current of the terminals. Other embodiments are described and claimed.
    Type: Grant
    Filed: October 19, 2005
    Date of Patent: March 25, 2008
    Assignee: Intel Corporation
    Inventors: Tawfik R. Arabi, Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray
  • AC testing of leakage current in integrated circuits using RC time constant
    Publication number: 20060033522
    Abstract: Some embodiments of the invention include apparatus and systems having integrated circuits. Terminals or pins of the integrated circuits are configured to be driven to a state, to be floated for a time interval, and to be measured to determine the state of the terminals after the time interval. The measurement involves sampling the RC time constant of leakage current of the terminals. Other embodiments are described and claimed.
    Type: Application
    Filed: October 19, 2005
    Publication date: February 16, 2006
    Inventors: Tawfik Arabi, Gregory Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray
  • AC testing of leakage current in integrated circuits using RC time constant
    Patent number: 6967496
    Abstract: A method of testing an integrated circuit includes applying a voltage to one of the pins of the integrated circuit. The pin is floated for a predetermined time. A measurement is performed after the predetermined time. The measurement involves sampling the RC time constant of leakage current of the pins.
    Type: Grant
    Filed: July 12, 2004
    Date of Patent: November 22, 2005
    Assignee: Intel Corporation
    Inventors: Tawfik R. Arabi, Gregory F. Taylor, Srirama Pedaria, Patrick Elwer, Dan Murray
  • AC testing of leakage current in integrated circuits using RC time constant
    Publication number: 20040246017
    Abstract: A method of testing an integrated circuit includes applying a voltage to one of the pins of the integrated circuit. The pin is floated for a predetermined time. A measurement is performed after the predetermined time. The measurement involves sampling the RC time constant of leakage current of the pins.
    Type: Application
    Filed: July 12, 2004
    Publication date: December 9, 2004
    Applicant: Intel Corporation
    Inventors: Tawfik R. Arabi, Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray
  • AC testing of leakage current in integrated circuits using RC time constant
    Patent number: 6777970
    Abstract: A method of testing an integrated circuit includes applying a voltage to one of the pins of the integrated circuit. The pin is floated for a predetermined time. A measurement is performed after the predetermined time. The measurement involves sampling the RC time constant of leakage current of the pins.
    Type: Grant
    Filed: April 19, 2001
    Date of Patent: August 17, 2004
    Assignee: Intel Corporation
    Inventors: Tawfik R. Arabi, Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray
  • AC testing of leakage current
    Publication number: 20020153914
    Abstract: A method of leakage test for an integrated circuit by sampling the RC time constant of leakage current of the pins of the integrated circuit.
    Type: Application
    Filed: April 19, 2001
    Publication date: October 24, 2002
    Applicant: Intel Corporation
    Inventors: Tawfik R. Arabi, Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray