Patents by Inventor Patrick Fernandes Machado

Patrick Fernandes Machado has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Up-scaling
    Patent number: 8325196
    Abstract: A method of up-scaling a first structure of samples representing a first property, the first structure having a source resolution, into a second structure of samples representing the first property, the second structure having a target resolution, on basis of a third structure of samples representing a second property, the third structure having the source resolution and on basis of a fourth structure of samples representing the second property, the fourth structure of samples having the target resolution, the method comprising: assigning weight factors to respective first samples of the first structure of samples on basis of differences between respective third samples of the third structure of samples and fourth samples of the fourth structure of samples; and computing the second samples of the second structure of samples on basis of the first samples of the first structure of samples and the respective weight factors.
    Type: Grant
    Filed: May 7, 2007
    Date of Patent: December 4, 2012
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Abraham Karel Riemens, Patrick Fernandes Machado, Christiaan Varekamp, Bart Gerard Bernard Barenbrug, Robert-Paul Mario Berretty
  • UP-SCALING
    Publication number: 20090179920
    Abstract: A method of up-scaling a first structure of samples representing a first property, the first structure having a source resolution, into a second structure of samples representing the first property, the second structure having a target resolution, on basis of a third structure of samples representing a second property, the third structure having the source resolution and on basis of a fourth structure of samples representing the second property, the fourth structure of samples having the target resolution, the method comprising: assigning weight factors to respective first samples of the first structure of samples on basis of differences between respective third samples of the third structure of samples and fourth samples of the fourth structure of samples; and computing the second samples of the second structure of samples on basis of the first samples of the first structure of samples and the respective weight factors.
    Type: Application
    Filed: May 7, 2007
    Publication date: July 16, 2009
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Abraham Karel Riemens, Patrick Fernandes Machado, Christiaan Varekamp, Bart Gerard Bernard Barenbrug, Robert-Paul Mario Berretty