Patents by Inventor Patrick G. Dannen

Patrick G. Dannen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated circuit testing apparatus
    Patent number: 6552555
    Abstract: An integrated circuit testing apparatus includes a probe card and a probe unit. The probe unit includes a plurality of conductive elastic bumps and a plurality of conductors positioned to conduct signals from the bumps to the probe card. The testing apparatus can further includes a substrate disposed between the probe card and the probe unit, and a flexible member disposed adjacent the substrate.
    Type: Grant
    Filed: November 19, 1999
    Date of Patent: April 22, 2003
    Assignee: Custom One Design, Inc.
    Inventors: Peter R. Nuytkens, Lev Bromberg, Patrick G. Dannen, Andrew D. Miller, Ahmed Mitwalli, Robert A. Most