Patents by Inventor Patrick H Lamey, Jr.

Patrick H Lamey, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6408219
    Abstract: A yield enhancement system organizes defect classification and attribute information into a global classification scheme. The global classes are used to identify defect sources and to generate inspection and review plans. The system accumulates defect information in a database and continually refines the information to improve the accuracy of the classification assignments and the identification of the defect sources.
    Type: Grant
    Filed: May 11, 1998
    Date of Patent: June 18, 2002
    Assignee: Applied Materials, Inc.
    Inventors: Patrick H Lamey, Jr., Amotz Maimon, Gad Yaron