Abstract: A method and apparatus for measuring a multiport device using a multiport test set connects one port of the multiport device to a stimulus signal and terminates all remaining ports in a respective load. A response to a stimulus signal is measured on all ports of the multiport device and the measured responses are corrected with calibration data to characterize the multiport device.

Abstract: According to one embodiment of the invention, there is provided a method of calibrating an N-port multiport test system for measurement of a DUT. The method consists of coupling each port of an N-port automatic calibration device to a respective port of the N-port multiport test system, and presenting three reflection standards with the automatic calibration device to each port of the N-port multiport test system. The method also consists of providing with the automatic calibration device, N−1 through conditions of a possible N(N−1)/2 possible through conditions, between corresponding ports of the N-port multiport test system, and making measurements with the N-port multiport test system of the three reflection standards at each port and the N−1 through conditions between the corresponding ports. The method further consists of determining all of systematic error coefficients for all of the ports of N-port multiport test system.

Abstract: A method and apparatus for measuring a multiport device using a multiport test set connects one port of the multiport device to a stimulus signal and terminates all remaining ports in a respective load. A response to a stimulus signal is measured on all ports of the multiport device and the measured responses are corrected with calibration data to characterize the multiport device.

Abstract: A method and apparatus for characterizing a device under test (“DUT”) calibrates a multiport test set and measures S-parameters [S] of the DUT. The method and apparatus further involves determining elements of a scalar orthogonal matrix [M] corresponding to terminals of the DUT and DUT modes of operation. The scalar orthogonal matrix [M] comprises a row of elements representing a single-ended terminal of the DUT, and four rows of elements representing a balanced terminal of the DUT. The S-parameters of the DUT are then transformed into mixed-mode S-parameters [Smm] according to Smm=MSM−1. A method of and apparatus for characterizing a DUT involves calibrating a multiport test set, coupling the DUT to the multiport test set, and measuring S-parameters of the DUT. The S-parameters are converted to a time domain representation and at least one of the S-parameters is convolved with a simulated input signal to generate an output response.

Abstract: According to one embodiment of the invention, there is provided a method of calibrating an N-port multiport test system for measurement of a DUT. The method consists of coupling each port of an N-port automatic calibration device to a respective port of the N-port multiport test system, and presenting three reflection standards with the automatic calibration device to each port of the N-port multiport test system. The method also consists of providing with the automatic calibration device, N−1 through conditions of a possible N(N−1)/2 possible through conditions, between corresponding ports of the N-port multiport test system, and making measurements with the N-port multiport test system of the three reflection standards at each port and the N−1 through conditions between the corresponding ports. The method further consists of determining all of systematic error coefficients for all of the ports of N-port multiport test system.

Abstract: One embodiment of the invention comprises a multiport test set that characterizes a multiterminal DUT. The multiport test set comprises a plurality of ports, a signal generator that provides a test signal over a frequency range, a reference receiver coupled to the signal generator that measures the test signal to determine a reference value, and at least one test channel receiver that measures the test signal at each port of the multiport test set. The multiport test set further comprises a switching device, coupled between the signal generator, the plurality of ports of the multiport test set and the at least one test channel receiver, that couples the test signal to any port of the multiport test set and to the at least one test channel receiver.