Patents by Inventor Patrick Jon Milligan

Patrick Jon Milligan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10657638
    Abstract: Various aspects of the disclosed technology relate to training and applying a machine learning model for defect pattern detection. Defect pattern variants of one or more defect patterns are generated. The one or more defect patterns are extracted from wafer maps of wafers having at least systematic defects. Each of the generated defect pattern variants is superimposed on wafer maps of wafers having no systematic defects to generate positive training data of wafer maps, which are included in a training dataset. Based on the training dataset, a trained machine-learning model for recognizing known defect patterns on wafer maps is derived.
    Type: Grant
    Filed: April 30, 2018
    Date of Patent: May 19, 2020
    Assignee: Mentor Graphics Corporation
    Inventor: Patrick Jon Milligan
  • Publication number: 20180330493
    Abstract: Various aspects of the disclosed technology relate to training and applying a machine learning model for defect pattern detection. Defect pattern variants of one or more defect patterns are generated. The one or more defect patterns are extracted from wafer maps of wafers having at least systematic defects. Each of the generated defect pattern variants is superimposed on wafer maps of wafers having no systematic defects to generate positive training data of wafer maps, which are included in a training dataset. Based on the training dataset, a trained machine-learning model for recognizing known defect patterns on wafer maps is derived.
    Type: Application
    Filed: April 30, 2018
    Publication date: November 15, 2018
    Inventor: Patrick Jon Milligan