Patents by Inventor Patrick Joseph LaCour

Patrick Joseph LaCour has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6799313
    Abstract: The present invention comprises a method and apparatus for classifying edges for implementing mask corrections. In one embodiment, classifications are based upon proximity ranges bounded on one side only. Before classifying an edge in a first class based on a first proximity range, it is verified that the classification will produce a correction satisfying a minimum manufacturable length. If the prescribed correction for the first class does produce a correction satisfying the minimum manufacturable length, the edge is classified in a second class corresponding to a second proximity range to produce, in combination with an adjacent edge also in the second class, manufacturable correction. The number of mask corrections implemented in a mask design is thus increased while ensuring that all mask corrections meet guidelines for manufacturability and reducing required clean-up of nonmanufacturable corrections in the design.
    Type: Grant
    Filed: June 4, 2003
    Date of Patent: September 28, 2004
    Inventor: Patrick Joseph LaCour
  • Patent number: 6703167
    Abstract: The present invention comprises a method and apparatus for prioritizing the implementation of resolution-enhancing mask corrections such as scattering bars on lithography tools. Prioritizing conflicting resolution-enhancing mask corrections produces a lithography tool having improved fidelity because corrections that provide the most beneficial effects can be implemented at the expense of corrections that provide less benefit. In a preferred embodiment, the prioritization is based on the geometry of the conflicting correction. For example, assist features that are closer to their respective generating edge may be assigned higher priorities, and assist features generated from orthogonal edges may be assigned higher priorities than features generated from angled edges.
    Type: Grant
    Filed: April 18, 2001
    Date of Patent: March 9, 2004
    Inventor: Patrick Joseph LaCour
  • Publication number: 20030208742
    Abstract: The present invention comprises a method and apparatus for classifying edges for implementing mask corrections. In one embodiment, classifications are based-upon proximity ranges bounded on one side only. Before classifying an edge in a first class based on a first proximity range, it is verified that the classification will produce a correction satisfying a minimum manufacturable length. If the prescribed correction for the first class does produce a correction satisfying the minimum manufacturable length, the edge is classified in a second class corresponding to a second proximity range to produce, in combination with an adjacent edge also in the second class, a manufacturable correction. The number of mask corrections implemented in a mask design is thus increased while ensuring that all mask corrections meet guidelines for manufacturability and reducing required clean-up of nonmanufacturable corrections in the design.
    Type: Application
    Filed: June 4, 2003
    Publication date: November 6, 2003
    Inventor: Patrick Joseph LaCour
  • Patent number: 6601231
    Abstract: The present invention comprises a method and apparatus for classifying edges for implementing mask corrections. In one embodiment, classifications are based upon proximity ranges bounded on one side only. Before classifying an edge in a first class based on a first proximity range, it is verified that the classification will produce a correction satisfying a minimum manufacturable length. If the prescribed correction for the first class does produce a correction satisfying the minimum manufacturable length, the edge is classified in a second class corresponding to a second proximity range to produce, in combination with an adjacent edge also in the second class, a manufacturable correction. The number of mask corrections implemented in a mask design is thus increased while ensuring that all mask corrections meet guidelines for manufacturability and reducing required clean-up of nonmanufacturable corrections in the design.
    Type: Grant
    Filed: July 10, 2001
    Date of Patent: July 29, 2003
    Inventor: Patrick Joseph LaCour
  • Publication number: 20030014731
    Abstract: The present invention comprises a method and apparatus for classifying edges for implementing mask corrections. In one embodiment, classifications are based upon proximity ranges bounded on one side only. Before classifying an edge in a first class based on a first proximity range, it is verified that the classification will produce a correction satisfying a minimum manufacturable length. If the prescribed correction for the first class does produce a correction satisfying the minimum manufacturable length, the edge is classified in a second class corresponding to a second proximity range to produce, in combination with an adjacent edge also in the second class, a manufacturable correction. The number of mask corrections implemented in a mask design is thus increased while ensuring that all mask corrections meet guidelines for manufacturability and reducing required clean-up of nonmanufacturable corrections in the design.
    Type: Application
    Filed: July 10, 2001
    Publication date: January 16, 2003
    Inventor: Patrick Joseph LaCour
  • Publication number: 20020155357
    Abstract: The present invention comprises a method and apparatus for prioritizing the implementation of resolution-enhancing mask corrections such as scattering bars on lithography tools. Prioritizing conflicting resolution-enhancing mask corrections produces a lithography tool having improved fidelity because corrections that provide the most beneficial effects can be implemented at the expense of corrections that provide less benefit. In a preferred embodiment, the prioritization is based on the geometry of the conflicting correction. For example, assist features that are closer to their respective generating edge may be assigned higher priorities, and assist features generated from orthogonal edges may be assigned higher priorities than features generated from angled edges.
    Type: Application
    Filed: April 18, 2001
    Publication date: October 24, 2002
    Inventor: Patrick Joseph LaCour