Patents by Inventor Patrick Kurth

Patrick Kurth has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Phase plate for a transmission electron microscope
    Patent number: 9460890
    Abstract: The present invention relates to a method for cleaning a phase plate (1) for a transmission electron microscope wherein said phase plate is etched before being irradiated for the first time in the TEM, and is then held in an ultra-pure holding atmosphere until the irradiation in the TEM.
    Type: Grant
    Filed: November 19, 2014
    Date of Patent: October 4, 2016
    Assignee: FEI COMPANY
    Inventors: Patrick Kurth, Steffen Pattai, Joerg Wamser
  • PHASE PLATE FOR A TRANSMISSION ELECTRON MICROSCOPE
    Publication number: 20150136172
    Abstract: The present invention relates to a method for cleaning a phase plate (1) for a transmission electron microscope wherein said phase plate is etched before being irradiated for the first time in the TEM, and is then held in an ultra-pure holding atmosphere until the irradiation in the TEM.
    Type: Application
    Filed: November 19, 2014
    Publication date: May 21, 2015
    Applicant: FEI Company
    Inventors: Patrick Kurth, Steffen Pattai, Joerg Wamser