Patents by Inventor Patrick Kurth

Patrick Kurth has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240410856
    Abstract: A calibration reference element for pH measuring instruments includes a reference liquid with a defined pH value and a tubular bag for holding the reference liquid. The tubular bag consists of a foil that is sealed along a maximum of three sealing edges. A calibration reference system comprised of at least two such calibration reference elements with reference liquids and different pH values. The holder used for a calibration reference element allows it to be positioned so that the reference liquid is conveniently available for calibration. Accordingly, a calibration set includes a holder and calibration reference elements or a calibration reference system.
    Type: Application
    Filed: September 13, 2022
    Publication date: December 12, 2024
    Inventors: Silvan Lüthi, Patrick Kurth
  • Publication number: 20240175840
    Abstract: An electrode holder comprises a bottom plate (10) and an electrode arm (100). The bottom plate (10) comprises at least one coupling structure for mounting a container or a sachet holder to it in a defined positional relation to the electrode arm. The electrode arm (100) comprises a clamp (55) to hold an electrode and is equipped to guide an electrode held by the clamp (70) to a container or sachet holder mounted to the at least one coupling structure.
    Type: Application
    Filed: November 28, 2022
    Publication date: May 30, 2024
    Inventors: Patrick Kurth, Silvan Lüthi, Mike Treyer, Peng Wei, Wang Heqiao, He Bing
  • Patent number: 9460890
    Abstract: The present invention relates to a method for cleaning a phase plate (1) for a transmission electron microscope wherein said phase plate is etched before being irradiated for the first time in the TEM, and is then held in an ultra-pure holding atmosphere until the irradiation in the TEM.
    Type: Grant
    Filed: November 19, 2014
    Date of Patent: October 4, 2016
    Assignee: FEI COMPANY
    Inventors: Patrick Kurth, Steffen Pattai, Joerg Wamser
  • Publication number: 20150136172
    Abstract: The present invention relates to a method for cleaning a phase plate (1) for a transmission electron microscope wherein said phase plate is etched before being irradiated for the first time in the TEM, and is then held in an ultra-pure holding atmosphere until the irradiation in the TEM.
    Type: Application
    Filed: November 19, 2014
    Publication date: May 21, 2015
    Applicant: FEI Company
    Inventors: Patrick Kurth, Steffen Pattai, Joerg Wamser