Patents by Inventor Patrick M. Cowan

Patrick M. Cowan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6960774
    Abstract: The present invention is generally directed to fault detection and control methodologies for ion implant processes, and a system for performing same. In one illustrative embodiment, the method comprises performing a tuning process for an ion implant tool, the tuning process resulting in at least one tool parameter for the ion implant tool, selecting or creating a fault detection model for an ion implant process to be performed in the ion implant tool based upon the tool parameter resulting from the tuning process, and monitoring an ion implant process performed in the ion implant tool using the selected or created fault detection model.
    Type: Grant
    Filed: November 3, 2003
    Date of Patent: November 1, 2005
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Elfido Coss, Jr., Patrick M. Cowan, Richard J. Markle, Tom Tse
  • Patent number: 6925347
    Abstract: A method and apparatus is provided for a process control based on an estimated process result. The method comprises processing a workpiece using a processing tool, receiving trace data associated with the processing of the workpiece from the processing tool and estimating at least one process result of the workpiece based on at least a portion of the received trace data. The method further comprises adjusting processing of a next workpiece based on the estimated at least one process result.
    Type: Grant
    Filed: August 19, 2002
    Date of Patent: August 2, 2005
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Michael L. Miller, Thomas J. Sonderman, Alexander J. Pasadyn, Richard J. Markle, Brian K. Cusson, Patrick M. Cowan, Timothy L. Jackson, Naomi M. Jenkins
  • Patent number: 6740534
    Abstract: A method and an apparatus for the determination of a process flow based upon fault detection. A process step upon a workpiece is performed. Fault detection analysis based upon the process step performed upon the workpiece is performed. A workpiece routing process is performed based upon the fault detection analysis. The wafer routing process includes using a controller to perform one or a rework process routing, a non-standard process routing, a fault verification process routing, a normal process routing, or a termination process routing, based upon the fault detection analysis.
    Type: Grant
    Filed: September 18, 2002
    Date of Patent: May 25, 2004
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Ernest D. Adams, III, Matthew A. Purdy, Gregory A. Cherry, Eric O. Green, Elfido Coss, Jr., Brian K. Cusson, Naomi M. Jenkins, Patrick M. Cowan
  • Patent number: 6594589
    Abstract: A method for monitoring health of a tool includes receiving at least one tool parameter related to the processing of a workpiece in a tool; receiving a model selection trigger; selecting a tool health model based on the model selection trigger; generating at least one predicted tool parameter based on the selected tool health model; and generating a tool health rating for the tool based on a comparison between the measured tool parameter and the predicted tool parameter. A tool health monitor includes a library of tool health models, a model selector, and a fault detection and classification unit. The model selector is adapted to receive a model selection trigger and select a tool health model based on the model selection trigger.
    Type: Grant
    Filed: May 23, 2001
    Date of Patent: July 15, 2003
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Elfido Coss, Jr., Richard J. Markle, Patrick M. Cowan