Abstract: A method for physicochemical analysis of a material during its ablation with a pulsed laser. The method uses the ratio of intensity levels of two emission lines of a tracer element derived from plasma generated by the laser beam to characterize the plasma excitation temperature. The method determines concentration of an element to be measured in the plasma using standard measurements indicating correspondence between a concentration of the element to measured and a variation of intensity of an emission line and different ratios between intensity levels of two emission lines of the tracer element, the ratios representing the plasma temperature.

Abstract: A method for physicochemical analysis of a material during its ablation with a pulsed laser. The method uses the ratio of intensity levels of two emission lines of a tracer element derived from plasma generated by the laser beam to characterize the plasma excitation temperature. The method determines concentration of an element to be measured in the plasma using standard measurements indicating correspondence between a concentration of the element to measured and a variation of intensity of an emission line and different ratios between intensity levels of two emission lines of the tracer element, the ratios representing the plasma temperature.

Abstract: This device comprises a pulsed laser source (6), means (8, 10, 12) for focusing light from this source onto an object to be analysed (2) to produce plasma on the surface of the object, means (16, 18) of analyzing a plasma radiation spectrum, means (20) of determining the elementary composition of the object from this analysis, and possibly means (4) for displacing the object. The invention is particularly applicable to test radioactive materials.

Abstract: This device comprises a pulsed laser source (6), means (8, 10, 12) for focusing light from this source onto an object to be analysed (2) to produce plasma on the surface of the object, means (16, 18) of analysing a plasma radiation spectrum, means (20) of determining the elementary composition of the object from this analysis, and possibly means (4) for displacing the object. The invention is particularly applicable to test radioactive materials.

Abstract: Isotopic analysis process by optical emission spectrometry on laser-produced plasma. According to the invention, the sample to be analyzed (10) is irradiated by a laser beam (20) to produce a plasma (13), the light spectrum emitted by said plasma is analyzed and from it is deduced the isotopic composition of the sample. Application to isotopic analysis in the nuclear industry.

Abstract: A process for simultaneously blowing a gas jet onto a sample 6 to be analyzed and subsequently focusing a laser beam 4 onto the sample so as to produce a plasma 12 on the surface of the sample. An analysis is made of the spectrum S' of the light radiation emitted by the plasma and this spectrum analysis provides the basis for determining the composition of the isotopic composition of the sample.

Abstract: Process for the determination of traces of uranium in solution by the spectrofluorimetry method. The fluorescence of the uranium molecules in the solution is excited by a pulsed laser shot. The exponential decay curve of this fluorescence is studied for a given wavelength. The value F.sub.O of said same fluorescence is deduced at the end of each laser pulse and is compared with the value F'.sub.O obtained for a standard uranium solution and containing a known uranium quantity.