Patents by Inventor Patrick Maxton

Patrick Maxton has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement of thin film properties using plasmons
    Publication number: 20050057754
    Abstract: Properties of thin electrically conductive films are measured using plasmons. The plasmons are excited in the film using a suitable pump beam of electromagnetic radiation. A probe beam of electromagnetic radiation is directed onto the excited film and is diffracted thereby and the diffracted beam is detected. The detected signal indicates film properties such as thickness and surface roughness.
    Type: Application
    Filed: July 8, 2004
    Publication date: March 17, 2005
    Inventors: David Smith, Behzad Imani, Nader Shamma, Patrick Maxton, Mark Brongersma