Abstract: Various embodiments of a system and method for creating and controlling a model of a sensor device for a computer simulation are disclosed. Sensor information specifying physical properties of the sensor device may be received, and a model of the sensor device may be automatically generated using the sensor information. An electrical circuit simulation may be performed using the model of the sensor device. The system and method may enable the user to interactively change the sensor device model during the simulation. The user may interact with a graphical user interface during the simulation to provide input specifying a change in one or more physical properties of the sensor device. In response to the user input, the model of the sensor device may be dynamically modified during the simulation to simulate the change in the one or more physical properties of the sensor device.

Abstract: Various embodiments of a system and method for creating and controlling a model of a sensor device for a computer simulation are disclosed. Sensor information specifying physical properties of the sensor device may be received, and a model of the sensor device may be automatically generated using the sensor information. An electrical circuit simulation may be performed using the model of the sensor device. The system and method may enable the user to interactively change the sensor device model during the simulation. The user may interact with a graphical user interface during the simulation to provide input specifying a change in one or more physical properties of the sensor device. In response to the user input, the model of the sensor device may be dynamically modified during the simulation to simulate the change in the one or more physical properties of the sensor device.

Abstract: System and method for generating test information for a physical circuit. A virtual circuit may be generated. First user input specifying one or more test conditions and/or instrument settings for the virtual circuit may be received. In response to the first user input, first test information may be generated. The first test information may be configured for use in performing one or more virtual tests on the virtual circuit. Second user input requesting that second test information be generated based on the first test information may be received. The second test information may be automatically generated based on the first test information in response to the second user input, without user input specifying the one or more test conditions and/or instrument settings. The second test information may be configured for use in performing one or more physical tests on a physical circuit corresponding to the virtual circuit.