Abstract: A non-flat sample is analyzed by a first spectrometer which has previously been calibrated for flat sample analysis. The non-flat sample is then analyzed by a second spectrometer calibrated for flat samples. The values collected from analysis of the non-flat sample by the first spectrometer are plotted against values collected from analysis of non-flat samples by the second spectrometer. The plot identifies a differences between the first spectrometer values and the second spectrometer values. The plot values are used in conjunction with the standard values from the first spectrometer to calculate final standard values for the second spectrometer. Final standard values for the second spectrometer are then used to generate calibration curves for the second spectrometer.

Abstract: A method for calibrating a plurality of spectrometers for analysis of non-flat surfaces. Initially, a non-flat sample is analyzed by a first spectrometer which has previously been calibrated for flat sample analysis. The standard values for use in flat sample analysis have therefore previously been generated. Values generated by the analysis of the non-flat sample undertaken by the first spectrometer are collected. A non-flat sample is then analyzed by a second spectrometer where the second spectrometer has also been calibrated for flat samples. Value generated by analysis of the non-flat sample undertaken by the second spectrometer are then collected. The values collected from the analysis of the non-flat sample by the first spectrometer are plotted against the values collected from the analysis of the non-flat samples by the second spectrometer. The plot identifies a differences between the first spectrometer values and the second spectrometer values.