Patents by Inventor Patrick R. Holley

Patrick R. Holley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11256481
    Abstract: Methods and systems for developing software can perform both compilation operations and read-evaluate-print-loop (REPL) operations on source code. In one embodiment, an integrated development environment can include a source code editor and a compiler and can perform the following operations: receiving source code and performing REPL operations as the source code is received; receiving edits in the source code for which REPL operations have been performed and compiling, by the compiler, the edited source code; and storing results of execution of the edited source code for use in subsequent REPL operations.
    Type: Grant
    Filed: May 28, 2019
    Date of Patent: February 22, 2022
    Assignee: APPLE INC.
    Inventors: Alexander B. Brown, Kenneth S. Orr, Matthew M. Patenaude, Murat N. Konar, Patrick R. Holley, Samuel C. Page
  • Publication number: 20190369968
    Abstract: Methods and systems for developing software can perform both compilation operations and read-evaluate-print-loop (REPL) operations on source code. In one embodiment, an integrated development environment can include a source code editor and a compiler and can perform the following operations: receiving source code and performing REPL operations as the source code is received; receiving edits in the source code for which REPL operations have been performed and compiling, by the compiler, the edited source code; and storing results of execution of the edited source code for use in subsequent REPL operations.
    Type: Application
    Filed: May 28, 2019
    Publication date: December 5, 2019
    Inventors: Alexander B. Brown, Kenneth S. Orr, Matthew M. Patenaude, Murat N. Konar, Patrick R. Holley, Samuel C. Page
  • Patent number: 8966447
    Abstract: In one embodiment, an automated user-level testing tool is enhanced to capture additional information about the state of the automated testing, beyond just a screenshot of the application-under-test. In another embodiment, an automated user-level testing tool is enhanced to capture testing state information for multiple points in time (referred to as “snapshots”), beyond just when the application-under-test crashes. This captured information from one execution of an automated test (one “test run”) is stored in one test log, which can then be viewed using a test log viewer. In one embodiment, the graphical user interface (GUI) for the test log viewer includes four areas: a screenshot area, a test script area, a stack trace area, and a timing area. The content shown in the screenshot area, the test script area, and the stack trace area is specific to a particular point in time during a test (e.g., a particular snapshot).
    Type: Grant
    Filed: June 20, 2011
    Date of Patent: February 24, 2015
    Assignee: Apple Inc.
    Inventors: Evan M. Hoke, Patrick R. Holley, Jonathan M. Deutsch
  • Publication number: 20110314343
    Abstract: In one embodiment, an automated user-level testing tool is enhanced to capture additional information about the state of the automated testing, beyond just a screenshot of the application-under-test. In another embodiment, an automated user-level testing tool is enhanced to capture testing state information for multiple points in time (referred to as “snapshots”), beyond just when the application-under-test crashes, This captured information from one execution of an automated test (one “test run”) is stored in one test log, which can then be viewed using a test log viewer. In one embodiment, the graphical user interface (GUI) for the test log viewer includes four areas: a screenshot area, a test script area, a stack trace area, and a timing area. The content shown in the screenshot area, the test script area, and the stack trace area is specific to a particular point in time during a test (e.g., a particular snapshot).
    Type: Application
    Filed: June 20, 2011
    Publication date: December 22, 2011
    Applicant: APPLE INC.
    Inventors: Evan M. Hoke, Patrick R. Holley, Jonathan M. Deutsch