Abstract: In some embodiments, systems are provided to determine distances to one or more objects, and comprise an image capture system; an angular movement system; an illumination source providing illumination having a time varying amplitude; and a range measurement circuit configured to: obtain, based on at least one of measured and induced LOS angular displacement changes relative to the image capture system, a set of candidate point-spread-functions (PSFs) corresponding to different possible ranges; deconvolve, using the candidate PSFs, at least a region of interest (ROI) in an evaluation image to obtain at least a set of deconvolved ROIs of the evaluation image, each corresponding to one of the candidate PSFs; identify a first candidate PSF that produces a deconvolved ROI resulting in a determined artifact power that is lower than a corresponding artifact power determined from the other candidate PSFs; and determine a distance corresponding to the first candidate PSF.

Abstract: In some embodiments, systems are provided to determine distances to one or more objects, and comprise an image capture system; an angular movement system; an illumination source providing illumination having a time varying amplitude; and a range measurement circuit configured to: obtain, based on at least one of measured and induced LOS angular displacement changes relative to the image capture system, a set of candidate point-spread-functions (PSFs) corresponding to different possible ranges; deconvolve, using the candidate PSFs, at least a region of interest (ROI) in an evaluation image to obtain at least a set of deconvolved ROIs of the evaluation image, each corresponding to one of the candidate PSFs; identify a first candidate PSF that produces a deconvolved ROI resulting in a determined artifact power that is lower than a corresponding artifact power determined from the other candidate PSFs; and determine a distance corresponding to the first candidate PSF.

Abstract: Some embodiments provide enhanced resolution imaging systems comprising: a mounting; an electro-optical image capture system; an angular jitter sensor system; an illumination source system; and an image capture control circuit is configured to: receive ling of sight displacement sensor data; obtain, during the capture frame, an angular displacement of the image capture system and monitor when the detected angular displacement of the image capture system, based on the sensor data, is beyond an angular displacement threshold envelope; and activate exposure of the image capture system to illumination, during the capture frame, when the detected angular displacement of the image capture system is within the angular displacement threshold envelope, and control a level of exposure of the image capture system to illumination, during the capture frame, when the detected angular displacement is not within the angular displacement threshold envelope.

Abstract: Some embodiments provide enhanced resolution imaging systems. These systems comprise: a mounting configured to secure with a vehicle; an electro-optical image capture system configured to sequentially obtain a series of frames per second; and a first jitter compensation system comprising: an angular velocity sensor system to detect velocity of change of line of sight angular displacement of the image capture system; and an image capture control circuit is configured to: receive, in real-time, angular velocity data from the angular velocity sensor system; identify, during the frame, when an angular velocity is less than an angular velocity threshold; and activate, during the frame, exposure of the image capture system to illumination for at least one of: at least a minimum integration period of time during the frame, and while the angular velocity is less than the angular velocity threshold during the frame.

Abstract: Some embodiments provide enhanced resolution imaging systems comprising: a mounting; an electro-optical image capture system; an angular jitter sensor system; an illumination source system; and an image capture control circuit is configured to: receive ling of sight displacement data; obtain, during the capture frame, an angular displacement of the image capture system and monitor when the detected angular displacement of the image capture system, based on the LOS angular displacement data, is beyond an angular displacement threshold envelope; and activate exposure of the image capture system to illumination, during the capture frame, when the detected angular displacement of the image capture system is within the angular displacement threshold envelope, and control a level of exposure of the image capture system to illumination, during the capture frame, when the detected angular displacement is not within the angular displacement threshold envelope.

Abstract: The present invention relates to systems and methods for preparing reactively sputtered films. The films are generally thin transition metal oxide (TMO) films having an optimum stoichiometry for any useful device (e.g., a sub-stoichiometric thin film for a memristor device). Described herein are systems, methods, and calibrations processes that employ rapid control of partial pressures to obtain the desired film.

Abstract: The present invention relates to resistive random-access memory (RRAM or ReRAM) systems, as well as methods of employing multiple state variables to form degenerate states in such memory systems. The methods herein allow for precise write and read steps to form multiple state variables, and these steps can be performed electrically. Such an approach allows for multilevel, high density memory systems with enhanced information storage capacity and simplified information retrieval.

Abstract: The present invention is directed generally to resistive random-access memory (RRAM or ReRAM) devices and systems, as well as methods of employing a thermal resistive model to understand and determine switching of such devices. In particular example, the method includes generating a power-resistance measurement for the memristor device and applying an isothermal model to the power-resistance measurement in order to determine one or more parameters of the device (e.g., filament state).

Abstract: A resistive switching device and methods for making the same are disclosed. In the above said device, a resistive switching layer is interposed between opposing electrodes. The resistive switching layer comprises at least two sub-layers of switchable insulative material characterized by different ionic mobilities.